| 영문 | official name(=generic name) | 한글 | 일반명 |
|---|---|---|---|
| 설명 | 약의 이름을 부를때 일반명과 이에 반하는 상표명(brand name: trade name)이 있다. 일반명은 약의 성분에 따라 붙이는 이름으로 비록 상표명은 달라도 그 일반명은 모두 동일할 수 있다. 예를 들어 ampicillin(항생제의 일종)이라는 일반명에 대해 각 회사에서는 모두 이 성분에 따라 약을 만들지만, 고유한 Amcill, 0mnipen, Penbritin, Polycillin 등의 각기 다른 상표를 붙이게 된다. |
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| 영문 | electron microscope | 한글 | 전자현미경 |
|---|---|---|---|
| 설명 | 전기 마당 또는 자기 마당을 이용하여 전자류를 전자 렌즈에 집속시켜, 그 통로에 놓인 표본의 상을 확대하는 장치. 광학 현미경보다 훨씬 뛰어난 분해 능력을 가진다. |
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| AES | acetone-extracted serum; American Electroencephalographic Society; American Encephalographic Society... |
|---|---|
| APS | adenosine phosphosulfate; American Pain Society; American Pediatric Society; American Physiological ... |
| EM | early memory; ejection murmur; electromagnetic; electron micrograph; electron microscopy, electron m... |
| AEM | Academic Emergency Medicine [journal]; analytical electron microscopy; ambulatory electrocardiograph... |
| E/M | electron microscope, electron microscopy; evaluation and management |
| JCOG | Japan Clinical Oncology Group |
|---|---|
| AOAC | Association of Official Analytical Chemists |
| JAMA | Journal of the American Medical Association |
| NEJM | New England Journal of Medicine |
| ASCO | American Society of Clinical Oncology |
| American Cancer Society | <address, organisation> American Cancer Society, National Headquarters, 1599 Clifton Road, NE, Atlanta, GA 30329 USA. Tel: 00 1 404 320-3333 (05 Feb 1998) |
|---|---|
| journal article | The predominant publication type for articles and other items indexed for nlm databases. (12 Dec 1998) |
| japan | Of or pertaining to Japan, or to the lacquered work of that country; as, Japan ware. <botany> Japan allspice, a cloverlike plant (Lespedeza striata) from Eastern Asia, useful for fodder, first noticed in the Southern United States about 1860, but now become very common. During the Civil War it was called variously Yankee clover and Rebel clover. Japan earth. See Catechu. Japan ink, a kind of writing ink, of a deep, glossy black when dry. Japan varnish, a varnish prepared from the milky juice of the Rhus vernix, a small Japanese tree related to the poison sumac. Source: Websters Dictionary (01 Mar 1998) |
| Japan wax | A vegetable wax derived from Rhus succedanea and Toxicodendron verniciferum. (05 Mar 2000) |
| aperture for electron microscopy | <technique> Anode aperture: The opening in the accelerating voltage anode shield of the electron gun through which the electrons must pass to irradiate the specimen. Condenser aperture: An opening in the condenser lens controlling the number of electrons entering the lens and the angular aperture of the electron beam. The angular aperture can also be controlled by the condenser lens current. Physical objective aperture: A metallic diaphragm, with a small central hole, used to limit the cone of electrons accepted by the objective lens. This improves image-contrast since highly scattered electrons are prevented from arriving at the Gaussian image plane and therefore cannot contribute to background fog. Aplanatic. Free from spherical aberration and coma. (05 Aug 1998) |
| microscopy, electron | Visual and photographic microscopy in which electron beams with wavelengths thousands of times shorter than visible light are used in place of light, thereby allowing much greater magnification. (12 Dec 1998) |
| microscopy, electron, scanning | Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point, giving the surface image a three-dimensional quality. (12 Dec 1998) |
| microscopy, electron, scanning transmission | A type of electron microscopy which scans with an extremely narrow beam that is transmitted through the sample. The detection apparatus produces an image whose brightness depends on the atomic number of the sample. It should not be confused with microscopy, electron scanning nor with microscopy, electron, transmission (see microscopy, electron). (12 Dec 1998) |
| Conventional Transmission Electron Microscopy | <technique> A term applied to 'normal' transmission electron microscopy imaging. The electron beam is passed through a thin film sample (typically ~1-200 nm thick). Bright field diffraction contrast images are formed with the direct (undiffracted) beam. Dark field images are formed with a selected diffracted beam. CTEM imaging is used in the general observation of samples and careful selection of the diffracting conditions of the sample will allow the analysis of defect structures within the sample. (05 Aug 1998) |
| scanning electron microscopy | <procedure> Technique of electron microscopy in which the specimen is coated with heavy metal and then scanned by an electron beam. The image is built up on a monitor screen (in the same way as the raster builds a conventional television image). The resolution is not so great as with transmission electron microscopy, but preparation is easier (often by fixation followed by critical point drying), the depth of focus is relatively enormous, the surface of a specimen can be seen (though not the interior unless the specimen is cracked open) and the image is aesthetically pleasing. (18 Nov 1997) |
| scanning transmission electron microscopy | <procedure> Method of electron microscopy in which image formation depends upon analysis of the pattern of energies of electrons that pass through the specimen. Has comparable resolving power to conventional transmission EM. (18 Nov 1997) |
| immune electron microscopy | Electron microscopy of biological specimens to which specific antibody has been bound. (05 Mar 2000) |
| electron microscopy | <procedure> Any form of microscopy in which the interactions of electrons with the specimens are used to provide information about the final structure of that specimen. In transmission electron microscopy the diffraction and adsorption of electrons as the electron beam passes normally through the specimen is imaged to provide information on the specimen. In scanning electron microscopy an electron beam falls at a nonnormal angle on the specimen and the image is derived from the scattered and reflected electrons. Secondary X-rays generated by the interaction of electrons with various elements in the specimen may be used for electron microprobe analysis. (18 Nov 1997) |
| transmission electron microscopy | <technique> Those forms of electron microscopy in which electrons are transmitted through the object to be imaged, suffering energy loss by diffraction and to a small extent by absorption. Acronym: TEM (18 Nov 1997) |
| Environmental Scanning Electron Microscopy | <technique> Scanning electron microscopy is performed by scanning a focused probe across the surface of the sample to be studied. In the environmental scanning electron microscopy the composition and pressure of the atmosphere around the specimen may be controlled. In favourable cases non-conductive specimens may be examined without coating, and hydrated specimens may be examined with the water still in place. Acronym: ESEM (05 Aug 1998) |
제품명 |
판매사 |
보험코드 | 성분/함량 | 구분/보험급여 |
|---|
제품명 |
판매사 |
보험코드 | 성분/함량 | 구분/보험급여 |
|---|