| 영문 | electron microscope | 한글 | 전자현미경 |
|---|---|---|---|
| 설명 | 전기 마당 또는 자기 마당을 이용하여 전자류를 전자 렌즈에 집속시켜, 그 통로에 놓인 표본의 상을 확대하는 장치. 광학 현미경보다 훨씬 뛰어난 분해 능력을 가진다. |
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| EM | early memory; ejection murmur; electromagnetic; electron micrograph; electron microscopy, electron m... |
|---|---|
| TRAP | Tartrate Resistant Acid Phosphatase |
| TRAP | carpal tunnel syndrome, Raynaud phenomenon, aching muscles, proximal muscle weakness [rheumatic diso... |
| trap | trapezius |
| EI | Edmonton injector; electrolyte imbalance; electron impact; electron ionization; emotionally impaired... |
| TRAP | Athrombospondin-related anonymous protein |
|---|---|
| TRAP | Radical-Trapping Antioxidant Parameter |
| TRAP | Tartrate resistant acid phosphatase |
| TRAP+ | Tartrate-resistant acid phosphatase-positive |
| TRAP | Telomeric Repeat Amplification Protocol |
| drain-trap stomach | water-trap stomach |
|---|---|
| enhancer trap | <molecular biology, technique> Technique for mapping gene expression patterns, classically in Drosophila. A transposon element carrying a reporter gene (usually _ galactosidase), linked to a very weak promoter, is induced to jump within the genome. If the P element re inserts within the sphere of influence of promoters and enhancers of some (random) gene, then reporter gene is also expressed in a similar tissue specific manner. Usually, many lines of flies carrying such random insertions are studied, if a line shows interesting patterns of expression, it can be possible to clone the gene of interest. (18 Nov 1997) |
| trap | <geology> An old term rather loosely used to designate various dark-coloured, heavy igneous rocks, including especially the feldspathic-augitic rocks, basalt, dolerite, amygdaloid, etc, but including also some kinds of diorite. Called also trap rock. Trap tufa, Trap tuff, a kind of fragmental rock made up of fragments and earthy materials from trap rocks. Origin: Sw. Trapp; akin to trappa stairs, Dan. Trappe, G. Treppe, D. Trap; so called because the rocks of this class often occur in large, tabular masses, rising above one another, like steps. See Tramp. 1. A machine or contrivance that shuts suddenly, as with a spring, used for taking game or other animals; as, a trap for foxes. "She would weep if that she saw a mouse Caught in a trap." (Chaucer) 2. A snare; an ambush; a stratagem; any device by which one may be caught unawares. "Let their table be made a snare and a trap." (Rom. Xi. 9) "God and your majesty Protect mine innocence, or I fall into The trap is laid for me!" (Shak) 3. A wooden instrument shaped somewhat like a shoe, used in the game of trapball. It consists of a pivoted arm on one end of which is placed the ball to be thrown into the air by striking the other end. Also, a machine for throwing into the air glass balls, clay pigeons, etc, to be shot at. 4. The game of trapball. 5. A bend, sag, or partitioned chamber, in a drain, soil pipe, sewer, etc, arranged so that the liquid contents form a seal which prevents passage of air or gas, but permits the flow of liquids. 6. A place in a water pipe, pump, etc, where air accumulates for want of an outlet. 7. A wagon, or other vehicle. 8. A kind of movable stepladder. Trap stairs, a staircase leading to a trapdoor. <botany> Trap tree the jack; so called because it furnishes a kind of birdlime. See 1st Jack. Origin: OE. Trappe, AS. Treppe; akin to OD.trappe, OHG. Trapo; probably fr. The root of E. Tramp, as that which is trod upon: cf. F. Trappe, which is trod upon: cf. F. Trappe, which perhaps influenced the English word. Source: Websters Dictionary (01 Mar 1998) |
| aperture for electron microscopy | <technique> Anode aperture: The opening in the accelerating voltage anode shield of the electron gun through which the electrons must pass to irradiate the specimen. Condenser aperture: An opening in the condenser lens controlling the number of electrons entering the lens and the angular aperture of the electron beam. The angular aperture can also be controlled by the condenser lens current. Physical objective aperture: A metallic diaphragm, with a small central hole, used to limit the cone of electrons accepted by the objective lens. This improves image-contrast since highly scattered electrons are prevented from arriving at the Gaussian image plane and therefore cannot contribute to background fog. Aplanatic. Free from spherical aberration and coma. (05 Aug 1998) |
| Auger electron | An electron ejected from a lower energy orbital after a photoelectric interaction of an X-ray photon with a K-shell electron by the characteristic radiation photon; the Auger electron recoils with energy equal to the characteristic radiation less the difference in shell binding energies. See: photoelectric effect. (05 Mar 2000) |
| backscattered electron | <microscopy> Produced by an incident electron colliding with the nucleus of an atom in the specimen. The incident electron is then scattered backward about 180 degrees with no appreciable loss of energy, an elastic collision. (05 Aug 1998) |
| backscattered electron imaging | <microscopy> The production of backscattered electrons from a sample varies directly with the specimen's average atomic number, higher atomic number elements produce more backscattered electrons than lower atomic number ones. Detection of Backscattered Electrons is achieved by using a donut shaped solid state saemiconductor device mounted on the bottom of the objective lens. When Backscattered Electrons strike the detector electron-hole pairs are created which are then counted. This quantity is translated into a pixel intensity and displayed on the CRT, forming the image. By splitting the detector into halves (or quadrants) differences in the signal level on the individual detector segments provide surface topography information. (05 Aug 1998) |
| valence electron | One of the electron's that take part in chemical reactions of an atom. (05 Mar 2000) |
| Parallel Electron Energy Loss Spectroscopy | <technique> Electron energy loss spectroscopy analyses the inelastically scattered electrons present in the beam after it has been transmitted through the sample. An electron energy loss spectrum typically consists of a monatomic decreasing background on which are superimposed a number of peaks. Each peak is characteristic of the scattering process that has occurred in the sample. The peaks can be used to obtain information about the chemical composition and electronic structure of the sample. Electron energy loss spectra are acquired typically in a magnetic sector spectrometer located under the camera chamber of the transmission electron microscope. Spatial resolution is typically limited by the minimum probe diameter of the microscope. Electron energy loss spectroscopy tends to be complimentary to EDS in that it can be used to analyse very thin samples of low Z materials. Acronym: PEELS (05 Aug 1998) |
| reverse electron transport | <chemistry> The energy-dependent movement of electrons against the thermodynamic gradient to form a strong reductant from a weaker electron donor. (11 Jan 1998) |
| microscope, electron | <microscopy> An electron-optical device which produces a magnified image of an object. Detail may be revealed by virtue of selective transmission, reflection, or emission of electrons by the object. (05 Aug 1998) |
| microscopy, electron | Visual and photographic microscopy in which electron beams with wavelengths thousands of times shorter than visible light are used in place of light, thereby allowing much greater magnification. (12 Dec 1998) |
| microscopy, electron, scanning | Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point, giving the surface image a three-dimensional quality. (12 Dec 1998) |
| microscopy, electron, scanning transmission | A type of electron microscopy which scans with an extremely narrow beam that is transmitted through the sample. The detection apparatus produces an image whose brightness depends on the atomic number of the sample. It should not be confused with microscopy, electron scanning nor with microscopy, electron, transmission (see microscopy, electron). (12 Dec 1998) |
| Conventional Transmission Electron Microscopy | <technique> A term applied to 'normal' transmission electron microscopy imaging. The electron beam is passed through a thin film sample (typically ~1-200 nm thick). Bright field diffraction contrast images are formed with the direct (undiffracted) beam. Dark field images are formed with a selected diffracted beam. CTEM imaging is used in the general observation of samples and careful selection of the diffracting conditions of the sample will allow the analysis of defect structures within the sample. (05 Aug 1998) |
제품명 |
판매사 |
보험코드 | 성분/함량 | 구분/보험급여 |
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제품명 |
판매사 |
보험코드 | 성분/함량 | 구분/보험급여 |
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