| 영문 | electron microscope | 한글 | 전자현미경 |
|---|---|---|---|
| 설명 | 전기 마당 또는 자기 마당을 이용하여 전자류를 전자 렌즈에 집속시켜, 그 통로에 놓인 표본의 상을 확대하는 장치. 광학 현미경보다 훨씬 뛰어난 분해 능력을 가진다. |
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| 영문 | hepatic portal system | 한글 | 간문맥계 |
|---|---|---|---|
| 설명 | 위, 작은창자이나 큰창자에서 영양분을 흡수하기 위한 모세혈관조직은 모두 간으로 연결된다. 즉 소화기에 흡수한 영양분이 가득한 피는 모두 간으로 연결되는데 이것을 문맥계라고 한다. |
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| 영문 | system | 한글 | 계, 계통 |
|---|---|---|---|
| 설명 | 인체를 구성하는 계는 다음과 같이 구분된다. 1) 심장혈관계통(cardiovascular system) 2) 호흡기계(respiratory system) 3) 소화기계(digeshive system) 4) 비뇨기계(urinary system) 5) 생식기계(genital system) 6) 혈액계(hematologic system) 7) 내분비계(endocrine system) 8) 신경계(nervous system) 9) 골격계(skeletal system) 10) 근육계(muscular system) 11) 피부계(integumentary system). |
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| 영문 | sympathetic nervous system | 한글 | 교감신경계 |
|---|---|---|---|
| 설명 | 자율신경계의 일종으로 내장기능을 주로 항진시켜 활동을 증가시키는 기능을 가진다. 자율신경계의 다른 계열인 부교감신경계는 반대로 내장기능을 억제시켜 에너지를 비축하는 기능을 가진다. 자율신경계의 해부학적 특성은 신경이 중추신경계에서 나와 목표장기에 도달하기 전에 한번의 시냅스(synapse)를 이룬다는 점이며, 따라서 자율신경계는 두 개의 신경(시냅스를 이루기 전의 절전신경과 이룬 후의 절후신경)으로 구성된다. 자율신경계중 교감신경계는 중추신경계 즉 척수 부근의 교감신경절(sympathetic ganglion)에서 시냅스가 일어나고, 부교감 신경계는 중추신경계에서 멀리 떨어진 목표 장기부근의 신경절(ganglion)에서 시냅스가 일어나는 점이 다르다. |
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| 영문 | musculoskeletal System | 한글 | 근골격계 |
|---|---|---|---|
| 설명 | 근육과 이들 근육이 붙어서 같이 활동을 수행하는 골격(뼈를 통털어 말함)을 함께 부르는 말. 따라서 여기의 근육은 모두 가로무늬근에 속하며, 수의적으로 움직일 수 있다. |
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| EM | early memory; ejection murmur; electromagnetic; electron micrograph; electron microscopy, electron m... |
|---|---|
| ISIS | image selected in vivo spectroscopy; imaging science and information system; information system-imag... |
| EI | Edmonton injector; electrolyte imbalance; electron impact; electron ionization; emotionally impaired... |
| E/M | electron microscope, electron microscopy; evaluation and management |
| MDS | Master of Dental Surgery; maternal deprivation syndrome; medical data screening; medical data system... |
| ETS | electron transport system |
|---|---|
| T system | tubular system |
| AES | Augar electron spectroscopy |
| BSE | Back scattered electron |
| BEI | Backscattered Electron Imaging |
| electron optical system | <apparatus> A combination of parts capable of producing and controlling a beam of electrons to produce an image of an object. (05 Aug 1998) |
|---|---|
| electron transport system | The mitochondrial electron transport chain. (18 Nov 1997) |
| aperture for electron microscopy | <technique> Anode aperture: The opening in the accelerating voltage anode shield of the electron gun through which the electrons must pass to irradiate the specimen. Condenser aperture: An opening in the condenser lens controlling the number of electrons entering the lens and the angular aperture of the electron beam. The angular aperture can also be controlled by the condenser lens current. Physical objective aperture: A metallic diaphragm, with a small central hole, used to limit the cone of electrons accepted by the objective lens. This improves image-contrast since highly scattered electrons are prevented from arriving at the Gaussian image plane and therefore cannot contribute to background fog. Aplanatic. Free from spherical aberration and coma. (05 Aug 1998) |
| Auger electron | An electron ejected from a lower energy orbital after a photoelectric interaction of an X-ray photon with a K-shell electron by the characteristic radiation photon; the Auger electron recoils with energy equal to the characteristic radiation less the difference in shell binding energies. See: photoelectric effect. (05 Mar 2000) |
| backscattered electron | <microscopy> Produced by an incident electron colliding with the nucleus of an atom in the specimen. The incident electron is then scattered backward about 180 degrees with no appreciable loss of energy, an elastic collision. (05 Aug 1998) |
| backscattered electron imaging | <microscopy> The production of backscattered electrons from a sample varies directly with the specimen's average atomic number, higher atomic number elements produce more backscattered electrons than lower atomic number ones. Detection of Backscattered Electrons is achieved by using a donut shaped solid state saemiconductor device mounted on the bottom of the objective lens. When Backscattered Electrons strike the detector electron-hole pairs are created which are then counted. This quantity is translated into a pixel intensity and displayed on the CRT, forming the image. By splitting the detector into halves (or quadrants) differences in the signal level on the individual detector segments provide surface topography information. (05 Aug 1998) |
| valence electron | One of the electron's that take part in chemical reactions of an atom. (05 Mar 2000) |
| Parallel Electron Energy Loss Spectroscopy | <technique> Electron energy loss spectroscopy analyses the inelastically scattered electrons present in the beam after it has been transmitted through the sample. An electron energy loss spectrum typically consists of a monatomic decreasing background on which are superimposed a number of peaks. Each peak is characteristic of the scattering process that has occurred in the sample. The peaks can be used to obtain information about the chemical composition and electronic structure of the sample. Electron energy loss spectra are acquired typically in a magnetic sector spectrometer located under the camera chamber of the transmission electron microscope. Spatial resolution is typically limited by the minimum probe diameter of the microscope. Electron energy loss spectroscopy tends to be complimentary to EDS in that it can be used to analyse very thin samples of low Z materials. Acronym: PEELS (05 Aug 1998) |
| reverse electron transport | <chemistry> The energy-dependent movement of electrons against the thermodynamic gradient to form a strong reductant from a weaker electron donor. (11 Jan 1998) |
| microscope, electron | <microscopy> An electron-optical device which produces a magnified image of an object. Detail may be revealed by virtue of selective transmission, reflection, or emission of electrons by the object. (05 Aug 1998) |
| microscopy, electron | Visual and photographic microscopy in which electron beams with wavelengths thousands of times shorter than visible light are used in place of light, thereby allowing much greater magnification. (12 Dec 1998) |
| microscopy, electron, scanning | Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point, giving the surface image a three-dimensional quality. (12 Dec 1998) |
| microscopy, electron, scanning transmission | A type of electron microscopy which scans with an extremely narrow beam that is transmitted through the sample. The detection apparatus produces an image whose brightness depends on the atomic number of the sample. It should not be confused with microscopy, electron scanning nor with microscopy, electron, transmission (see microscopy, electron). (12 Dec 1998) |
| Conventional Transmission Electron Microscopy | <technique> A term applied to 'normal' transmission electron microscopy imaging. The electron beam is passed through a thin film sample (typically ~1-200 nm thick). Bright field diffraction contrast images are formed with the direct (undiffracted) beam. Dark field images are formed with a selected diffracted beam. CTEM imaging is used in the general observation of samples and careful selection of the diffracting conditions of the sample will allow the analysis of defect structures within the sample. (05 Aug 1998) |
| Convergent Beam Electron Diffraction | <microscopy> An electron probe is tightly focused on a transmission electron microscopy specimen and the resulting pattern of diffracted electrons is observed. The patterns contains information on the crystal symmetry and atomic and electronic structure of the sample. Regions as small as 0.2 nm may be examined. Acronym: CBED (05 Aug 1998) |
제품명 |
판매사 |
보험코드 | 성분/함량 | 구분/보험급여 |
|---|
제품명 |
판매사 |
보험코드 | 성분/함량 | 구분/보험급여 |
|---|