| 영문 | electron microscope | 한글 | 전자현미경 |
|---|---|---|---|
| 설명 | 전기 마당 또는 자기 마당을 이용하여 전자류를 전자 렌즈에 집속시켜, 그 통로에 놓인 표본의 상을 확대하는 장치. 광학 현미경보다 훨씬 뛰어난 분해 능력을 가진다. |
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| 영문 | intermittent positive pressure breathing(IPPB) | 한글 | 간헐적양압호흡 |
|---|---|---|---|
| 설명 | 폐를 팽창시키기 위하여 대기압보다 높은 압력을 이용하는 인공호흡법이다. 신생아 무기폐의 치료나 만성 폐쇄성 호흡기 질환의 급성 악화시, 진단을 위한 가래의 배출을 위하여, 또는 약제의 흡입에 사용하고 있다. 합병증으로 공기가슴증이나 심박출량의 감소가 올 수 있다. |
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| 영문 | pulse pressure | 한글 | 맥박압 |
|---|---|---|---|
| 설명 | 수축기 혈압과 확장기 혈압의 차이. mmHg로 표시한다. 심장의 수축력, 동맥 내 혈류량, 동맥벽의 긴장도에 영향을 받는다. 정상치는 수축기 혈압의 1/3, 또는 확장기 혈압의 1/2이다. 60mmHg이상을 대맥이라고 하며, 대동맥판막 폐쇄부족증, 갑상샘항진증, 동맥경화증, 혈압이 상승할 때 심장비대, 고열 등에서 볼 수 있다. 20mmHg 이하를 소맥이라고 하며, 급성 심근경색에 의한 좌심실 수축력 저하, 대동맥판막 협착등에서 볼 수 있다. 한편 맥압의 1/3에 확장기 혈압을 더한 것을 평균혈압이라고 한다. |
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| 영문 | osmotic pressure | 한글 | 삼투압 |
|---|---|---|---|
| 설명 | 삼투라는 현상은 일정 크기 이하의 물질은 통과시키고 그 이상의 크기를 가진 물질은 통과 시키지 못하게 하는 막(반투막)을 사이에 두고 양쪽에 그 막을 투과하지 못하는 물질의 농도가 차이가 날 때 발생하는 것으로 막을 통과할 수 있는 물질이 막 양쪽의 통과 할 수 없는 물질의 농도를 같게 하는 방향으로 움직이는 것을 말한다. |
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| 영문 | systolic pressure | 한글 | 수축기압 |
|---|---|---|---|
| 설명 | 심활동력, 동맥벽의 탄력성, 혈액량, 혈액의 점성 등에 의하여 결정되는 혈액의 동맥벽에 미치는 압력으로서, 최고혈압은 왼심실로부터 박출이 끝나기 직전에 생기는 압을 말하고 최대 혈압 또는 수축기혈압이라 부른다. 최소혈압은 왼심실의 확장이 끝나는 시기에 생기는 혈압을 말하며 최소혈압 또는 확장기혈압이라고 부른다. 평균혈압은 동맥내압의 평균치를 말하며, 기초혈압은 절대안정 상태에서 측정한 혈압을 말한다. |
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| EM | early memory; ejection murmur; electromagnetic; electron micrograph; electron microscopy, electron m... |
|---|---|
| EI | Edmonton injector; electrolyte imbalance; electron impact; electron ionization; emotionally impaired... |
| E/M | electron microscope, electron microscopy; evaluation and management |
| MAP | malignant atrophic papulosis; mandibular angle plane; maturation-activated protein; maximal aerobic ... |
| PP | diphosphate group; emphysema [pink puffers]; near point of accommodation [Lat. punctum proximum]; pa... |
| PCO2 | pressure , carbon dioxide pressure |
|---|---|
| AES | Augar electron spectroscopy |
| BSE | Back scattered electron |
| BEI | Backscattered Electron Imaging |
| CBED | Convergent Beam Electron Diffraction |
pressure necrosis
| aperture for electron microscopy | <technique> Anode aperture: The opening in the accelerating voltage anode shield of the electron gun through which the electrons must pass to irradiate the specimen. Condenser aperture: An opening in the condenser lens controlling the number of electrons entering the lens and the angular aperture of the electron beam. The angular aperture can also be controlled by the condenser lens current. Physical objective aperture: A metallic diaphragm, with a small central hole, used to limit the cone of electrons accepted by the objective lens. This improves image-contrast since highly scattered electrons are prevented from arriving at the Gaussian image plane and therefore cannot contribute to background fog. Aplanatic. Free from spherical aberration and coma. (05 Aug 1998) |
|---|---|
| Auger electron | An electron ejected from a lower energy orbital after a photoelectric interaction of an X-ray photon with a K-shell electron by the characteristic radiation photon; the Auger electron recoils with energy equal to the characteristic radiation less the difference in shell binding energies. See: photoelectric effect. (05 Mar 2000) |
| backscattered electron | <microscopy> Produced by an incident electron colliding with the nucleus of an atom in the specimen. The incident electron is then scattered backward about 180 degrees with no appreciable loss of energy, an elastic collision. (05 Aug 1998) |
| backscattered electron imaging | <microscopy> The production of backscattered electrons from a sample varies directly with the specimen's average atomic number, higher atomic number elements produce more backscattered electrons than lower atomic number ones. Detection of Backscattered Electrons is achieved by using a donut shaped solid state saemiconductor device mounted on the bottom of the objective lens. When Backscattered Electrons strike the detector electron-hole pairs are created which are then counted. This quantity is translated into a pixel intensity and displayed on the CRT, forming the image. By splitting the detector into halves (or quadrants) differences in the signal level on the individual detector segments provide surface topography information. (05 Aug 1998) |
| valence electron | One of the electron's that take part in chemical reactions of an atom. (05 Mar 2000) |
| Parallel Electron Energy Loss Spectroscopy | <technique> Electron energy loss spectroscopy analyses the inelastically scattered electrons present in the beam after it has been transmitted through the sample. An electron energy loss spectrum typically consists of a monatomic decreasing background on which are superimposed a number of peaks. Each peak is characteristic of the scattering process that has occurred in the sample. The peaks can be used to obtain information about the chemical composition and electronic structure of the sample. Electron energy loss spectra are acquired typically in a magnetic sector spectrometer located under the camera chamber of the transmission electron microscope. Spatial resolution is typically limited by the minimum probe diameter of the microscope. Electron energy loss spectroscopy tends to be complimentary to EDS in that it can be used to analyse very thin samples of low Z materials. Acronym: PEELS (05 Aug 1998) |
| reverse electron transport | <chemistry> The energy-dependent movement of electrons against the thermodynamic gradient to form a strong reductant from a weaker electron donor. (11 Jan 1998) |
| microscope, electron | <microscopy> An electron-optical device which produces a magnified image of an object. Detail may be revealed by virtue of selective transmission, reflection, or emission of electrons by the object. (05 Aug 1998) |
| microscopy, electron | Visual and photographic microscopy in which electron beams with wavelengths thousands of times shorter than visible light are used in place of light, thereby allowing much greater magnification. (12 Dec 1998) |
| microscopy, electron, scanning | Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point, giving the surface image a three-dimensional quality. (12 Dec 1998) |
| microscopy, electron, scanning transmission | A type of electron microscopy which scans with an extremely narrow beam that is transmitted through the sample. The detection apparatus produces an image whose brightness depends on the atomic number of the sample. It should not be confused with microscopy, electron scanning nor with microscopy, electron, transmission (see microscopy, electron). (12 Dec 1998) |
| Conventional Transmission Electron Microscopy | <technique> A term applied to 'normal' transmission electron microscopy imaging. The electron beam is passed through a thin film sample (typically ~1-200 nm thick). Bright field diffraction contrast images are formed with the direct (undiffracted) beam. Dark field images are formed with a selected diffracted beam. CTEM imaging is used in the general observation of samples and careful selection of the diffracting conditions of the sample will allow the analysis of defect structures within the sample. (05 Aug 1998) |
| Convergent Beam Electron Diffraction | <microscopy> An electron probe is tightly focused on a transmission electron microscopy specimen and the resulting pattern of diffracted electrons is observed. The patterns contains information on the crystal symmetry and atomic and electronic structure of the sample. Regions as small as 0.2 nm may be examined. Acronym: CBED (05 Aug 1998) |
| conversion electron | An internal conversion electron. (05 Mar 2000) |
| positive electron | A subatomic particle of mass and charge equal to the electron but of opposite (i.e., positive) charge. Synonym: positive electron. (05 Mar 2000) |
제품명 |
판매사 |
보험코드 | 성분/함량 | 구분/보험급여 |
|---|
제품명 |
판매사 |
보험코드 | 성분/함량 | 구분/보험급여 |
|---|