| 영문 | electron microscope | 한글 | 전자현미경 |
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| 설명 | 전기 마당 또는 자기 마당을 이용하여 전자류를 전자 렌즈에 집속시켜, 그 통로에 놓인 표본의 상을 확대하는 장치. 광학 현미경보다 훨씬 뛰어난 분해 능력을 가진다. |
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| EM | early memory; ejection murmur; electromagnetic; electron micrograph; electron microscopy, electron m... |
|---|---|
| E/M | electron microscope, electron microscopy; evaluation and management |
| ACS | acrocallosal syndrome; acrocephalosyndactyly; acute chest syndrome; acute confusional state; Alcon C... |
| APC | acetylsalicylic acid, phenacetin, and caffeine; activated protein C; adenoidal-pharyngeal-conjunctiv... |
| NA | Avogadro constant or number; nalidixic acid; Narcotics Anonymous; network administrator; neuraminida... |
| TACT | Tuned Aperture Computed Tomography |
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| N.A. | numerical aperture |
| cryo-EM | Cryo-electron microscopy |
| Cryo-TEM | Cryo-transmission electron microscopy |
| EFTEM | Energy-filtering transmission electron microscopy |
| aperture for electron microscopy | <technique> Anode aperture: The opening in the accelerating voltage anode shield of the electron gun through which the electrons must pass to irradiate the specimen. Condenser aperture: An opening in the condenser lens controlling the number of electrons entering the lens and the angular aperture of the electron beam. The angular aperture can also be controlled by the condenser lens current. Physical objective aperture: A metallic diaphragm, with a small central hole, used to limit the cone of electrons accepted by the objective lens. This improves image-contrast since highly scattered electrons are prevented from arriving at the Gaussian image plane and therefore cannot contribute to background fog. Aplanatic. Free from spherical aberration and coma. (05 Aug 1998) |
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| microscopy, electron | Visual and photographic microscopy in which electron beams with wavelengths thousands of times shorter than visible light are used in place of light, thereby allowing much greater magnification. (12 Dec 1998) |
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| microscopy, electron, scanning | Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point, giving the surface image a three-dimensional quality. (12 Dec 1998) |
| microscopy, electron, scanning transmission | A type of electron microscopy which scans with an extremely narrow beam that is transmitted through the sample. The detection apparatus produces an image whose brightness depends on the atomic number of the sample. It should not be confused with microscopy, electron scanning nor with microscopy, electron, transmission (see microscopy, electron). (12 Dec 1998) |
| Conventional Transmission Electron Microscopy | <technique> A term applied to 'normal' transmission electron microscopy imaging. The electron beam is passed through a thin film sample (typically ~1-200 nm thick). Bright field diffraction contrast images are formed with the direct (undiffracted) beam. Dark field images are formed with a selected diffracted beam. CTEM imaging is used in the general observation of samples and careful selection of the diffracting conditions of the sample will allow the analysis of defect structures within the sample. (05 Aug 1998) |
| scanning electron microscopy | <procedure> Technique of electron microscopy in which the specimen is coated with heavy metal and then scanned by an electron beam. The image is built up on a monitor screen (in the same way as the raster builds a conventional television image). The resolution is not so great as with transmission electron microscopy, but preparation is easier (often by fixation followed by critical point drying), the depth of focus is relatively enormous, the surface of a specimen can be seen (though not the interior unless the specimen is cracked open) and the image is aesthetically pleasing. (18 Nov 1997) |
| scanning transmission electron microscopy | <procedure> Method of electron microscopy in which image formation depends upon analysis of the pattern of energies of electrons that pass through the specimen. Has comparable resolving power to conventional transmission EM. (18 Nov 1997) |
| immune electron microscopy | Electron microscopy of biological specimens to which specific antibody has been bound. (05 Mar 2000) |
| electron microscopy | <procedure> Any form of microscopy in which the interactions of electrons with the specimens are used to provide information about the final structure of that specimen. In transmission electron microscopy the diffraction and adsorption of electrons as the electron beam passes normally through the specimen is imaged to provide information on the specimen. In scanning electron microscopy an electron beam falls at a nonnormal angle on the specimen and the image is derived from the scattered and reflected electrons. Secondary X-rays generated by the interaction of electrons with various elements in the specimen may be used for electron microprobe analysis. (18 Nov 1997) |
| transmission electron microscopy | <technique> Those forms of electron microscopy in which electrons are transmitted through the object to be imaged, suffering energy loss by diffraction and to a small extent by absorption. Acronym: TEM (18 Nov 1997) |
| Environmental Scanning Electron Microscopy | <technique> Scanning electron microscopy is performed by scanning a focused probe across the surface of the sample to be studied. In the environmental scanning electron microscopy the composition and pressure of the atmosphere around the specimen may be controlled. In favourable cases non-conductive specimens may be examined without coating, and hydrated specimens may be examined with the water still in place. Acronym: ESEM (05 Aug 1998) |
| angle of aperture | <ophthalmology, optics> The angle formed by lines drawn from the ends of the diameter of a lens to its point of focus. See: angular aperture. (05 Mar 2000) |
| angular aperture | The angle, in air, of light that passes from the object to the ends of the diameter of the front lens of the microscope objective. (05 Mar 2000) |
| anterior nasal aperture | The anterior nasal opening in the skull. Synonym: apertura piriformis, piriform opening. (05 Mar 2000) |
| aperture | <physics> The opening in an optical system which restricts the size of the bundle of rays incident on a given surface. (Usually circular and specified by diameter.) (09 Oct 1997) |
| aperture, angular | <microscopy> The angle between the most divergent rays that can pass through a lens to form the image of an object. The angle subtended between the axis of a lens and the largest accepted angle of the image-forming rays. With microscope objectives the trigonometric sine of this angle is used to define numerical aperture but as measured from the axial object point. (05 Aug 1998) |
제품명 |
판매사 |
보험코드 | 성분/함량 | 구분/보험급여 |
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제품명 |
판매사 |
보험코드 | 성분/함량 | 구분/보험급여 |
|---|