| 영문 | electron microscope | 한글 | 전자현미경 |
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| 설명 | 전기 마당 또는 자기 마당을 이용하여 전자류를 전자 렌즈에 집속시켜, 그 통로에 놓인 표본의 상을 확대하는 장치. 광학 현미경보다 훨씬 뛰어난 분해 능력을 가진다. |
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| EM | early memory; ejection murmur; electromagnetic; electron micrograph; electron microscopy, electron m... |
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| ED | early-decision [applicant]; early differentiation; ectodermal dysplasia; ectopic depolarization; eff... |
| LEED | low-energy electron diffraction |
| LEEDS | low-energy electron diffraction spectroscopy |
| RHEED | reflection high-energy electron diffraction |
| CBED | Convergent Beam Electron Diffraction |
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| ISIS | Image Selected in Vivo Spectroscopy |
| MAD | Multi-wavelength anomalous diffraction |
| SIM | Selected Ion Monitoring |
| SRM | Selected reaction monitoring |
| Selected Area Electron Diffraction | <technique> In this diffraction mode an aperture is used to define the area from which a diffraction pattern is to be recorded from a thin sample. This aperture is typically located in an image plane below the sample. Selected Area Electron Diffraction patterns are simple spot patterns and are of use in phase determination (lattice spacing measurement) and defect analysis (sample orientation). Acronym: SAED (05 Aug 1998) |
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| Convergent Beam Electron Diffraction | <microscopy> An electron probe is tightly focused on a transmission electron microscopy specimen and the resulting pattern of diffracted electrons is observed. The patterns contains information on the crystal symmetry and atomic and electronic structure of the sample. Regions as small as 0.2 nm may be examined. Acronym: CBED (05 Aug 1998) |
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| electron diffraction | <technique> The phenomenon, or technique of producing diffraction patterns through the incidence of electrons upon matter. (05 Aug 1998) |
| grating, diffraction | <microscopy> A series of narrow, close, equally spaced, diffracting slits or grooves capable of dispersing light into its spectrum. Diffraction gratings and their replicas are also used as standards in micrometry, especially in electron microscopy. (05 Aug 1998) |
| X-ray diffraction | <investigation> Basis of powerful technique for determining the three dimensional structure of molecules, including complex biological macromolecules such as proteins and nucleic acids, that form crystals or regular fibres. Low angle X-ray diffraction is also used to investigate higher levels of ordered structure, as found in muscle fibres. (18 Nov 1997) |
| diffraction | When a wave train passes an obstacle secondary waves are set up that interfere with the primary wave and give rise to bands of constructive and destructive interference. Around a point source of light, in consequence, is a series of concentric light and dark bands (coloured bands with white light), a diffraction pattern. (18 Nov 1997) |
| diffraction grating | <microscopy> An artificially produced periodic array of scattering centres capable of producing a pattern of diffracted energy, such as accurately ruled lines on a plane surface. (05 Aug 1998) |
| interference diffraction patterns | The patterns arising from the recombination of beams of light or other waves after they have been split and one set of rays have undergone a phase retardation relative to the other. Such patterns formed by simple objects give information on the correctness of the focus and the presence or absence of optical defects. (18 Nov 1997) |
| optical diffraction | A technique used to obtain information about repeating patterns. Diffraction of visible light can be used to calculate spacings in the object. (18 Nov 1997) |
| three-dimensional diffraction pattern | <optics> The diffraction pattern (of a point source) that appears in the three-dimensional space in and near the focal plane. For an aberration-free, diffraction- limited system, the slice of the diffraction pattern in the focal plane is the Airy disk and its surrounding diffraction rings. Above and below focus, the pattern changes periodically along the axis of the light beam so that bright and dark Airy-disk-like patterns appear alternately. The axial period of repeat is spaced twice as far apart as the radial period of repeat in the Airy disk and its diffraction rings (05 Aug 1998) |
| aperture for electron microscopy | <technique> Anode aperture: The opening in the accelerating voltage anode shield of the electron gun through which the electrons must pass to irradiate the specimen. Condenser aperture: An opening in the condenser lens controlling the number of electrons entering the lens and the angular aperture of the electron beam. The angular aperture can also be controlled by the condenser lens current. Physical objective aperture: A metallic diaphragm, with a small central hole, used to limit the cone of electrons accepted by the objective lens. This improves image-contrast since highly scattered electrons are prevented from arriving at the Gaussian image plane and therefore cannot contribute to background fog. Aplanatic. Free from spherical aberration and coma. (05 Aug 1998) |
| Auger electron | An electron ejected from a lower energy orbital after a photoelectric interaction of an X-ray photon with a K-shell electron by the characteristic radiation photon; the Auger electron recoils with energy equal to the characteristic radiation less the difference in shell binding energies. See: photoelectric effect. (05 Mar 2000) |
| backscattered electron | <microscopy> Produced by an incident electron colliding with the nucleus of an atom in the specimen. The incident electron is then scattered backward about 180 degrees with no appreciable loss of energy, an elastic collision. (05 Aug 1998) |
| backscattered electron imaging | <microscopy> The production of backscattered electrons from a sample varies directly with the specimen's average atomic number, higher atomic number elements produce more backscattered electrons than lower atomic number ones. Detection of Backscattered Electrons is achieved by using a donut shaped solid state saemiconductor device mounted on the bottom of the objective lens. When Backscattered Electrons strike the detector electron-hole pairs are created which are then counted. This quantity is translated into a pixel intensity and displayed on the CRT, forming the image. By splitting the detector into halves (or quadrants) differences in the signal level on the individual detector segments provide surface topography information. (05 Aug 1998) |
| valence electron | One of the electron's that take part in chemical reactions of an atom. (05 Mar 2000) |
| Parallel Electron Energy Loss Spectroscopy | <technique> Electron energy loss spectroscopy analyses the inelastically scattered electrons present in the beam after it has been transmitted through the sample. An electron energy loss spectrum typically consists of a monatomic decreasing background on which are superimposed a number of peaks. Each peak is characteristic of the scattering process that has occurred in the sample. The peaks can be used to obtain information about the chemical composition and electronic structure of the sample. Electron energy loss spectra are acquired typically in a magnetic sector spectrometer located under the camera chamber of the transmission electron microscope. Spatial resolution is typically limited by the minimum probe diameter of the microscope. Electron energy loss spectroscopy tends to be complimentary to EDS in that it can be used to analyse very thin samples of low Z materials. Acronym: PEELS (05 Aug 1998) |
제품명 |
판매사 |
보험코드 | 성분/함량 | 구분/보험급여 |
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제품명 |
판매사 |
보험코드 | 성분/함량 | 구분/보험급여 |
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