| 영문 | electron microscope | 한글 | 전자현미경 |
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| 설명 | 전기 마당 또는 자기 마당을 이용하여 전자류를 전자 렌즈에 집속시켜, 그 통로에 놓인 표본의 상을 확대하는 장치. 광학 현미경보다 훨씬 뛰어난 분해 능력을 가진다. |
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| 영문 | environmental pollution | 한글 | 환경오염 |
|---|---|---|---|
| 설명 | 인간활동에 의해 발생하는 대기-수질-토양 오염 및 소음-진동 등으로 자연환경이나 생활환경을 손상시키는 현상. 공장-사업장 등에 생산활동, 자동차-기차-항공기-선박 등의 수송활동, 냉난방-취사-여가선용 등 일상생활을 포함한 각종 인간 활동에 의해 유발되는 인위적인 대기오염- 수질오염-토양오염-소음-진동-지반침하-악취 등의 발생으로 자연환경이나 생활환경을 손상시키고 궁극적으로는 사람의 생활 및 건강에 유해한 영향을 미치는 현상을 말한다. 이는 특히, 산업혁명 이후에 두드러지게 나타났으며, 인간활동이 주어진 환경공간의 고유한 자정능력을 초과할 경우 발생한다. 지금도 공해라고 표현하는 사람이 있으나 현재는 환경오염이라는 용어가 표준용어가 되었다. 공해라는 낱말의 어원은 영국의 공중불법방해에서 비롯되었다고 한다. 그러나 공해라는 말은 주로 일본에서 쓰이고 있을 뿐 국제적으로도 환경오염이라고 한다. |
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| EM | early memory; ejection murmur; electromagnetic; electron micrograph; electron microscopy, electron m... |
|---|---|
| SEM | sample evaluation method; scanning electron microscopy; secondary enrichment medium; standard error ... |
| TSEM | transmission scanning electron microscopy |
| E/M | electron microscope, electron microscopy; evaluation and management |
| CSLM | confocal scanning microscopy |
| ESEM | Environmental Scanning Electron Microscopy |
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| FESEM | Field Emission Scanning Electron Microscopy |
| HR-SEM | High-resolution scanning electron microscopy |
| LTSEM | Low temperature scanning electron microscopy |
| NSOM | Near-field scanning optical microscopy |
| Environmental Scanning Electron Microscopy | <technique> Scanning electron microscopy is performed by scanning a focused probe across the surface of the sample to be studied. In the environmental scanning electron microscopy the composition and pressure of the atmosphere around the specimen may be controlled. In favourable cases non-conductive specimens may be examined without coating, and hydrated specimens may be examined with the water still in place. Acronym: ESEM (05 Aug 1998) |
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| microscopy, electron, scanning | Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point, giving the surface image a three-dimensional quality. (12 Dec 1998) |
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| microscopy, electron, scanning transmission | A type of electron microscopy which scans with an extremely narrow beam that is transmitted through the sample. The detection apparatus produces an image whose brightness depends on the atomic number of the sample. It should not be confused with microscopy, electron scanning nor with microscopy, electron, transmission (see microscopy, electron). (12 Dec 1998) |
| scanning electron microscopy | <procedure> Technique of electron microscopy in which the specimen is coated with heavy metal and then scanned by an electron beam. The image is built up on a monitor screen (in the same way as the raster builds a conventional television image). The resolution is not so great as with transmission electron microscopy, but preparation is easier (often by fixation followed by critical point drying), the depth of focus is relatively enormous, the surface of a specimen can be seen (though not the interior unless the specimen is cracked open) and the image is aesthetically pleasing. (18 Nov 1997) |
| scanning transmission electron microscopy | <procedure> Method of electron microscopy in which image formation depends upon analysis of the pattern of energies of electrons that pass through the specimen. Has comparable resolving power to conventional transmission EM. (18 Nov 1997) |
| microscopy, scanning tunneling | Electron microscopy in which a very sharp conducting needle is swept just a few angstroms above the surface of a sample. The tiny tunneling current that flows between the sample and the needle tip is measured and from this are produced three-dimensional topographs, with a lateral resolution often as good as 1-2 angstroms and a vertical resolution of less than 1 angstrom. Due to their composition, biological samples are usually coated with a conductive layer, e.g., by depositing a thin metal or carbon film on top of the sample, to enhance their conductivity. (12 Dec 1998) |
| Scanning Probe Microscopy | <technique> Initially called Atomic Force Microscopy, this technique is now more typically termed Scanning Force Microscopy or Scanning Probe Microscopy. This instrument is essentially an extremely high resolution profilometre. A sharp tip, typically fabricated from silicon nitride, is scanned across the surface of a sample at a constant force by three piezoelectric ceramics. The piezoelectric ceramics are computer controlled via a feedback loop which monitors the position of the tip by means of an optical lever. (A laser is focused on the top of the tip support and the beam reflected into a position sensitive detector). The changes in height of the tip are used to form an image as the tip is scanned across the sample. Acronym: SPM (26 Mar 1998) |
| scanning tunnelling microscopy | <procedure> A form of ultra high resolution microscopy of a surface in which a very small current is passed through a surface and is detected by a microprobe of atomic dimnensions at its tip that scans the surface by use of a piezodrive. In the simplest form the current transferred to the probe is recorded as an indication of the contours of molecules on the surface above the local plane. In more complex forms feedback is used to hold the probe at a constant difference and the signal in the feedback loop indicates the contours of the molecule. Capable of resolving single atoms and known to work for nonconducting molecules as well as conducting ones. (18 Nov 1997) |
| scanning electron microscope | <instrument> An electron microscope in which the image is formed by a beam synchronised with an electron probe scanning the object. The intensity of the image forming beam is proportional to the scattering or secondary emission of the specimen where the probe strikes it (05 Aug 1998) |
| aperture for electron microscopy | <technique> Anode aperture: The opening in the accelerating voltage anode shield of the electron gun through which the electrons must pass to irradiate the specimen. Condenser aperture: An opening in the condenser lens controlling the number of electrons entering the lens and the angular aperture of the electron beam. The angular aperture can also be controlled by the condenser lens current. Physical objective aperture: A metallic diaphragm, with a small central hole, used to limit the cone of electrons accepted by the objective lens. This improves image-contrast since highly scattered electrons are prevented from arriving at the Gaussian image plane and therefore cannot contribute to background fog. Aplanatic. Free from spherical aberration and coma. (05 Aug 1998) |
| microscopy, electron | Visual and photographic microscopy in which electron beams with wavelengths thousands of times shorter than visible light are used in place of light, thereby allowing much greater magnification. (12 Dec 1998) |
| Conventional Transmission Electron Microscopy | <technique> A term applied to 'normal' transmission electron microscopy imaging. The electron beam is passed through a thin film sample (typically ~1-200 nm thick). Bright field diffraction contrast images are formed with the direct (undiffracted) beam. Dark field images are formed with a selected diffracted beam. CTEM imaging is used in the general observation of samples and careful selection of the diffracting conditions of the sample will allow the analysis of defect structures within the sample. (05 Aug 1998) |
| immune electron microscopy | Electron microscopy of biological specimens to which specific antibody has been bound. (05 Mar 2000) |
| electron microscopy | <procedure> Any form of microscopy in which the interactions of electrons with the specimens are used to provide information about the final structure of that specimen. In transmission electron microscopy the diffraction and adsorption of electrons as the electron beam passes normally through the specimen is imaged to provide information on the specimen. In scanning electron microscopy an electron beam falls at a nonnormal angle on the specimen and the image is derived from the scattered and reflected electrons. Secondary X-rays generated by the interaction of electrons with various elements in the specimen may be used for electron microprobe analysis. (18 Nov 1997) |
| transmission electron microscopy | <technique> Those forms of electron microscopy in which electrons are transmitted through the object to be imaged, suffering energy loss by diffraction and to a small extent by absorption. Acronym: TEM (18 Nov 1997) |
| calorimetry, differential scanning | Differential thermal analysis in which the sample compartment of the apparatus is a differential calorimeter, allowing an exact measure of the heat of transition independent of the specific heat, thermal conductivity, and other variables of the sample. (12 Dec 1998) |
제품명 |
판매사 |
보험코드 | 성분/함량 | 구분/보험급여 |
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제품명 |
판매사 |
보험코드 | 성분/함량 | 구분/보험급여 |
|---|