| PLM | percent labeled mitoses; periodic leg movement; plasma level monitoring; polarized light microscopy |
|---|---|
| PXM | projection x-ray microscopy; pseudoexfoliation material |
| SPAM | scanning photoacoustic microscopy |
| VIM | video-intensification microscopy; vimentin |
| WLM | white light microscopy; working level month [radon] |
| electron image | <microscopy> A representation of an object formed by a beam of electrons focused by an electron optical system. (05 Aug 1998) |
|---|---|
| electron interferometer | An interferometer that employs an electron beam in place of a light beam. (05 Mar 2000) |
| electron interferometry | Interferometry in which a beam of electrons is used instead of a beam of light. (05 Mar 2000) |
| electron lens | <physics> A device for focusing an electron beam. (05 Aug 1998) |
| electron magneton | bohr magneton |
| electron micrograph | <microscopy> A photographic reproduction of an image formed by the action of an electron beam. Electron microscope See: microscope, electron. (05 Aug 1998) |
| electron microprobe | A technique of elemental analysis in the electron microscope based on spectral analysis of the scattered X-ray emission from the specimen induced by the electron beam. Using this technique it is possible to obtain quantitative data on, for example: the calcium concentration in different parts of a cell, but it is necessary to use ultra thin frozen sections. (18 Nov 1997) |
| electron microscope | <instrument> A microscope (device used to magnify small objects) which beams electrons at and through the object of interest instead of light beams. Instead of a glass lens to bend the light, a powerful magnet is used to bend the electron beam. The microscope can only be operated in a vacuum. This type of microscope provides the greatest resolution of extremely small details available and has been used to see individual atoms in an object or substance. (09 Oct 1997) |
| electron optical axis | <physics> The path of an electron through an electron optical system along which it suffers no deflection due to lens fields. This axis does not necessarily coincide with the mechanical axis of the system. (05 Aug 1998) |
| electron optical system | <apparatus> A combination of parts capable of producing and controlling a beam of electrons to produce an image of an object. (05 Aug 1998) |
| electron optics | <study> The science that deals with propagation electrons, as light optics deals with that of light and its phenomena. Eye lens (see lens, eye). (05 Aug 1998) |
| electron paramagnetic resonance | <physics> A spectrometric method, based on measurement of electron spins and magnetic moments, for detecting and estimating free radicals in reactions and in biological systems. Synonym: electron paramagnetic resonance. (05 Mar 2000) |
| electron probe | <physics> A narrow beam of electrons used to scan or illuminate an object or screen. (05 Aug 1998) |
| electron probe microanalyser | <apparatus> The qualitative and quantitative use of X-rays excited by a microprobe of electrons. Available with scanning electron microscope and transmission electron microscope. Acronym: EMA (05 Aug 1998) |
| electron probe microanalysis | Identification and measurement of concentration of elements based on the fact that primary-emission X-rays emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It may be performed by an electron probe microanalyzer, an electron microscope microanalyzer, or by an electron microscope, or scanning electron microscope, fitted with an X-ray spectrometer. (12 Dec 1998) |