| IEM | immuno-electron microscopy; inborn error of metabolism |
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| ISEM | immunosorbent electron microscopy |
| PhEEM | photoemission electron microscopy |
| SEM | sample evaluation method; scanning electron microscopy; secondary enrichment medium; standard error ... |
| TEM | transmission electron microscope/ microscopy; triethylenemelamine |
| nanovid microscopy | <procedure> Technique of bright field light microscopy using electronic contrast enhancement and maximum numerical aperture. (18 Nov 1997) |
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| dark field microscopy | <procedure> A system of microscopy in which particles are illuminated at a very low angle from the side so that the background appears dark and the objects are seen by diffracted and reflected patches of light against a dark background. (18 Nov 1997) |
| immunoelectron microscopy | <technique> A technique for using an electron microscope to locate specific antigensin cells or tissue. (09 Oct 1997) |
| interference microscopy | <procedure> Although all image formation depends on interference, the term is generally restricted to systems in which contrast comes from the recombination of a reference beam with light that has been retarded by passing through the object. Because the phase retardation is a consequence of the difference in refractive index between specimen and medium and because the the refractive increment is almost the same for all biological molecules, it is possible to measure the amount of dry mass per unit area of the specimen by measuring the phase retardation. Quantification of the phase retardation is usually done by using a compensator to reduce the bright object to darkness (see Senarmont and Ehrlinghaus compensators). Two major optical systems have been used the Jamin Lebedeff system and the Mach Zehnder system. These instruments are often referred to as interferometers, since they are designed for measuring phase retardation. Although their use has passed out of fashion, it may be that they will be employed more frequently in future in conjunction with image analysing systems. (18 Nov 1997) |
| interference reflection microscopy | <procedure> An optical technique for detecting the topography of the side of a cell in contact with a planar substrate and for providing information on the separation of the plasmalemma from the substrate. Interference between the reflections from the substrate medium interface and the reflections from the plasmalemma medium interface generate the image. (18 Nov 1997) |
| time-lapse microscopy | Microscopy in which the same object (e.g., a cell) is photographed at regular time intervals over several hours. (05 Mar 2000) |
| fluorescence microscopy | <procedure> Any type of microscopy in which intrinsic or applied reagents are visualised. Intrinsic fluorescence is often referred to as auto fluorescence. The applied reagents typically include fluorescently labelled proteins that are reactive with sites in the specimen. In particular, fluorescently labelled antibodies are widely used to detect particular antigens in biological specimens. (18 Nov 1997) |
| light microscopy | <procedure> In contrast to electron microscopy. See: bright field, phase contrast, interference, interference contrast, interference reflection, dark field, confocal and fluorescence microscopy. (18 Nov 1997) |
| Auger electron | An electron ejected from a lower energy orbital after a photoelectric interaction of an X-ray photon with a K-shell electron by the characteristic radiation photon; the Auger electron recoils with energy equal to the characteristic radiation less the difference in shell binding energies. See: photoelectric effect. (05 Mar 2000) |
| backscattered electron | <microscopy> Produced by an incident electron colliding with the nucleus of an atom in the specimen. The incident electron is then scattered backward about 180 degrees with no appreciable loss of energy, an elastic collision. (05 Aug 1998) |
| backscattered electron imaging | <microscopy> The production of backscattered electrons from a sample varies directly with the specimen's average atomic number, higher atomic number elements produce more backscattered electrons than lower atomic number ones. Detection of Backscattered Electrons is achieved by using a donut shaped solid state saemiconductor device mounted on the bottom of the objective lens. When Backscattered Electrons strike the detector electron-hole pairs are created which are then counted. This quantity is translated into a pixel intensity and displayed on the CRT, forming the image. By splitting the detector into halves (or quadrants) differences in the signal level on the individual detector segments provide surface topography information. (05 Aug 1998) |
| valence electron | One of the electron's that take part in chemical reactions of an atom. (05 Mar 2000) |
| Parallel Electron Energy Loss Spectroscopy | <technique> Electron energy loss spectroscopy analyses the inelastically scattered electrons present in the beam after it has been transmitted through the sample. An electron energy loss spectrum typically consists of a monatomic decreasing background on which are superimposed a number of peaks. Each peak is characteristic of the scattering process that has occurred in the sample. The peaks can be used to obtain information about the chemical composition and electronic structure of the sample. Electron energy loss spectra are acquired typically in a magnetic sector spectrometer located under the camera chamber of the transmission electron microscope. Spatial resolution is typically limited by the minimum probe diameter of the microscope. Electron energy loss spectroscopy tends to be complimentary to EDS in that it can be used to analyse very thin samples of low Z materials. Acronym: PEELS (05 Aug 1998) |
| reverse electron transport | <chemistry> The energy-dependent movement of electrons against the thermodynamic gradient to form a strong reductant from a weaker electron donor. (11 Jan 1998) |
| microscope, electron | <microscopy> An electron-optical device which produces a magnified image of an object. Detail may be revealed by virtue of selective transmission, reflection, or emission of electrons by the object. (05 Aug 1998) |