| ATEM | analytic transmission electron microscopy |
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| CTEM | conventional transmission electron microscopy |
| EMC | electromagnetic compatibility; electron microscopy; emergency medical care; emergency medical coordi... |
| HREM | high-resolution electron microscopy |
| HRTEM | high-resolution transmission electron microscopy |
| microscopy | <technique> The science of the interpretive use, and applications of microscopes. (05 Aug 1998) |
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| microscopy, atomic force | Microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. A microcomputer keeps track of the vertical excursions as a function of the position of the probe in the horizontal plane and presents the sample's image. (12 Dec 1998) |
| microscopy, confocal | A light microscopic technique in which only a small spot is illuminated and observed at a time. An image is constructed through point-by-point scanning of the field in this manner. Light sources may be conventional or laser, and fluorescence or transmitted observations are possible. (12 Dec 1998) |
| microscopy, fluorescence | Microscopy of specimens stained with fluorescent dye (usually fluorescein isothiocyanate) or of naturally fluorescent materials, which emit light when exposed to ultraviolet or blue light. Immunofluorescence microscopy utilises antibodies that are labelled with fluorescent dye. (12 Dec 1998) |
| microscopy, immunoelectron | Microscopy in which the samples are first stained immunocytochemically and then examined using an electron microscope. Immunoelectron microscopy is used extensively in diagnostic virology as part of very sensitive immunoassays. (12 Dec 1998) |
| microscopy, interference | Microscopy in which physiological and photometric contrast in the image is influenced or produced by the action of optical components which regulate interference. (12 Dec 1998) |
| microscopy, phase-contrast | A form of interference microscopy in which variations of the refracting index in the object are converted into variations of intensity in the image. This is achieved by the action of a phase plate. (12 Dec 1998) |
| microscopy, polarization | Microscopy using polarised light in which phenomena due to the preferential orientation of optical properties with respect to the vibration plane of the polarised light are made visible and correlated parameters are made measurable. (12 Dec 1998) |
| microscopy, scanning tunneling | Electron microscopy in which a very sharp conducting needle is swept just a few angstroms above the surface of a sample. The tiny tunneling current that flows between the sample and the needle tip is measured and from this are produced three-dimensional topographs, with a lateral resolution often as good as 1-2 angstroms and a vertical resolution of less than 1 angstrom. Due to their composition, biological samples are usually coated with a conductive layer, e.g., by depositing a thin metal or carbon film on top of the sample, to enhance their conductivity. (12 Dec 1998) |
| microscopy, ultraviolet | Microscopy in which the image is formed by ultraviolet radiation and is displayed and recorded by means of photographic film. (12 Dec 1998) |
| microscopy, video | Microscopy in which television cameras are used to brighten magnified images that are otherwise too dark to be seen with the naked eye. It is used frequently in telepathology. (12 Dec 1998) |
| confocal microscopy | <procedure> A system of (usually) epifluorescence light microscopy in which a fine laser beam of light is scanned over the object through the objective lens. The technique is particularly good at rejecting light from outside the plane of focus and so produces higher effective resolution than is normally achieved. (18 Nov 1997) |
| polarization microscopy | <procedure> Any form of microscopy capable of detecting birefringent objects. Usually performed with a polarizing element below the stage to produce plane polarized light and an analyser that is set to give total extinction of the background and thus to detect any birefringence. (18 Nov 1997) |
| Scanning Probe Microscopy | <technique> Initially called Atomic Force Microscopy, this technique is now more typically termed Scanning Force Microscopy or Scanning Probe Microscopy. This instrument is essentially an extremely high resolution profilometre. A sharp tip, typically fabricated from silicon nitride, is scanned across the surface of a sample at a constant force by three piezoelectric ceramics. The piezoelectric ceramics are computer controlled via a feedback loop which monitors the position of the tip by means of an optical lever. (A laser is focused on the top of the tip support and the beam reflected into a position sensitive detector). The changes in height of the tip are used to form an image as the tip is scanned across the sample. Acronym: SPM (26 Mar 1998) |
| scanning tunnelling microscopy | <procedure> A form of ultra high resolution microscopy of a surface in which a very small current is passed through a surface and is detected by a microprobe of atomic dimnensions at its tip that scans the surface by use of a piezodrive. In the simplest form the current transferred to the probe is recorded as an indication of the contours of molecules on the surface above the local plane. In more complex forms feedback is used to hold the probe at a constant difference and the signal in the feedback loop indicates the contours of the molecule. Capable of resolving single atoms and known to work for nonconducting molecules as well as conducting ones. (18 Nov 1997) |