| EM | 1) Erythro-Mycin 2) Electron Microscopy |
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| TSEB | Total Skin Electron Beam |
| AEM | Academic Emergency Medicine [journal]; analytical electron microscopy; ambulatory electrocardiograph... |
| AES | acetone-extracted serum; American Electroencephalographic Society; American Encephalographic Society... |
| ATEM | analytic transmission electron microscopy |
| equilibrium centrifugation | A type of density gradient centrifugation used to separate proteins or nucleic acids from a mixture. (09 Oct 1997) |
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| equilibrium constant | <chemistry> The ratio of the reverse and forward rate constants for a reaction of the type: A + B = AB at equilibrium the equilibrium constant (K) equals the product of the concentrations of reactants divided by the concentration of product and has dimensions of concentration. Kd = (concentration A.concentration B) / (concentration AB). The affinity constant (Ka) is the reciprocal of the equilibrium constant. Dimension: moles per litre. In general the concept of Kd is more readily understood than that of Ka, for example: in considering the conversion of A to AB by the binding of ligand B, the Kd = B when A = AB. Thus Kd is equal to the ligand concentration which produces half maximal conversion (response). (10 Jan 1998) |
| equilibrium dialysis | In immunology, a method for determination of association constants for hapten-antibody reactions in a system in which the hapten (dialyzable) and antibody (nondialyzable) solutions are separated by semipermeable membranes. Since at equilibrium the quantity of free hapten will be the same in the two compartments, quantitative determinations can be made of hapten-bound antibody, free antibody, and free hapten. (05 Mar 2000) |
| equilibrium potential | <physiology> The membrane potential at which a particular type of ion or other particle does not diffuse through the membrane in either direction. (09 Oct 1997) |
| linkage equilibrium | <genetics> Situation that should exist in a population undisturbed by selection, migration, etc., in which all possible combinations of linked genes should be present at equal frequency. The situation is no more common than are such undisturbed populations. (18 Nov 1997) |
| aperture for electron microscopy | <technique> Anode aperture: The opening in the accelerating voltage anode shield of the electron gun through which the electrons must pass to irradiate the specimen. Condenser aperture: An opening in the condenser lens controlling the number of electrons entering the lens and the angular aperture of the electron beam. The angular aperture can also be controlled by the condenser lens current. Physical objective aperture: A metallic diaphragm, with a small central hole, used to limit the cone of electrons accepted by the objective lens. This improves image-contrast since highly scattered electrons are prevented from arriving at the Gaussian image plane and therefore cannot contribute to background fog. Aplanatic. Free from spherical aberration and coma. (05 Aug 1998) |
| Auger electron | An electron ejected from a lower energy orbital after a photoelectric interaction of an X-ray photon with a K-shell electron by the characteristic radiation photon; the Auger electron recoils with energy equal to the characteristic radiation less the difference in shell binding energies. See: photoelectric effect. (05 Mar 2000) |
| backscattered electron | <microscopy> Produced by an incident electron colliding with the nucleus of an atom in the specimen. The incident electron is then scattered backward about 180 degrees with no appreciable loss of energy, an elastic collision. (05 Aug 1998) |
| backscattered electron imaging | <microscopy> The production of backscattered electrons from a sample varies directly with the specimen's average atomic number, higher atomic number elements produce more backscattered electrons than lower atomic number ones. Detection of Backscattered Electrons is achieved by using a donut shaped solid state saemiconductor device mounted on the bottom of the objective lens. When Backscattered Electrons strike the detector electron-hole pairs are created which are then counted. This quantity is translated into a pixel intensity and displayed on the CRT, forming the image. By splitting the detector into halves (or quadrants) differences in the signal level on the individual detector segments provide surface topography information. (05 Aug 1998) |
| valence electron | One of the electron's that take part in chemical reactions of an atom. (05 Mar 2000) |
| Parallel Electron Energy Loss Spectroscopy | <technique> Electron energy loss spectroscopy analyses the inelastically scattered electrons present in the beam after it has been transmitted through the sample. An electron energy loss spectrum typically consists of a monatomic decreasing background on which are superimposed a number of peaks. Each peak is characteristic of the scattering process that has occurred in the sample. The peaks can be used to obtain information about the chemical composition and electronic structure of the sample. Electron energy loss spectra are acquired typically in a magnetic sector spectrometer located under the camera chamber of the transmission electron microscope. Spatial resolution is typically limited by the minimum probe diameter of the microscope. Electron energy loss spectroscopy tends to be complimentary to EDS in that it can be used to analyse very thin samples of low Z materials. Acronym: PEELS (05 Aug 1998) |
| reverse electron transport | <chemistry> The energy-dependent movement of electrons against the thermodynamic gradient to form a strong reductant from a weaker electron donor. (11 Jan 1998) |
| microscope, electron | <microscopy> An electron-optical device which produces a magnified image of an object. Detail may be revealed by virtue of selective transmission, reflection, or emission of electrons by the object. (05 Aug 1998) |
| microscopy, electron | Visual and photographic microscopy in which electron beams with wavelengths thousands of times shorter than visible light are used in place of light, thereby allowing much greater magnification. (12 Dec 1998) |
| microscopy, electron, scanning | Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point, giving the surface image a three-dimensional quality. (12 Dec 1998) |