¼±Åà - È»ìǥŰ/¿£ÅÍŰ
´Ý±â - ESC
KMLE °Ë»ö
°Ë»ö ¼³Á¤
¿Â¶óÀÎ ÀÇÇмÀû
ÀÇÇпë¾î »çÀü
ÀÇÇоà¾î
ÀÇÇлçÀü
ÇÑ¿µ/¿µÇÑ»çÀü
¿µ¿µ»çÀü
»çÀÌÆ® ¼Ò°³
Àç°Ë»ö
"dark field microscopy"¿¡ ´ëÇÑ ´ëÇÑÀÇÇù ÀÇÇпë¾î ¼¼ºÎ °Ë»ö °á°úÀÔ´Ï´Ù
À̰ÍÀ» ¿øÇϼ̽À´Ï±î?
Darkfield microscopy
dark field microscope
dark-field microscopy
dark-field microscope
darkfield microscope
´ëÇÑÀÇÇù ÀÇÇпë¾î »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú :
15
ÆäÀÌÁö:
2
¿µ¹®
ÇѱÛ
B1 field gradient
ȸÀüÀÚÀå±â¿ï±â
binocular field
¾ç¾È½Ã¾ß, µÎ´«½Ã¾ß
boost field
Á¶»ç¿µ¿ª, Á¶»ç¸é
complex receptive field
º¹ÇÕ¼ö¿ë¾ß
comprehensive field irradiation
±¤¹üÀ§Á¶»ç
congruous field defect
ÀÏÄ¡½Ã¾ß°á¼Õ
diplopia field
º¹½Ã½Ã¾ß, °ãº¸Àӽþß
electric field
Àü±âÀå
electromagnetic field
ÀüÀÚ±âÀå
field
1. ºÐ¾ß, ¿µ¿ª, ¹üÀ§ 2. ºÎÀ§ 3. ½Ã¾ß 4. Àü±âÀå
field block
ºÎÀ§Â÷´Ü
field defect
½Ã¾ß°á¼Õ
field inhomogeneity
ÀÚÀåºÒ±ÕÁú¼º
field survey
ÇöÁöÁ¶»ç
field test
½ÇÁõ°Ë»ç
ÀÌÀü
´ÙÀ½
¿¾ ´ëÇÑÀÇÇù ÀÇÇпë¾î »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú :
15
ÆäÀÌÁö:
2
¿µ¹®
ÇѱÛ
geometric field distortion artifact
±âÇÏÇÐÀûÀÚÀå¿Ö°îÀΰø¹°
B1 field gradient
ȸÀüÀÚÀå±â¿ï±â
binocular field
¾ç¾È½Ã¾ß, µÎ´«½Ã¾ß
boost field
Á¶»ç¿µ¿ª, Á¶»ç¸é
field block
ºÎÀ§Â÷´Ü¸¶Ãë
complex receptive field
º¹ÇÕ¼ö¿ë¾ß
comprehensive field irradiation
±¤¹üÀ§Á¶»ç
confrontation field test
´ë¸é½Ã¾ß°Ë»ç
congruous field defect
ÀÏÄ¡½Ã¾ß°áÇÔ
constant field equation
Á¤ÀüÀ广Á¤½Ä
diplopia field
º¹½Ã½Ã¾ß, °ãº¸Àӽþß
field defect
½Ã¾ß°á¼Õ
incongruous field defect
ºÒÀÏÄ¡½Ã¾ß°á¼Õ
visual field defect
½Ã¾ß°á¼Õ
electric field
Àü±âÀå
ÀÌÀü
´ÙÀ½
¿¾ ´ëÇÑÀÇÇù 2 ÀÇÇпë¾î »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú :
14
ÆäÀÌÁö:
2
¿µ¹®
ÇѱÛ
fringe field
ÁÖº¯ ¾ß
fringe magnetic field strength
ÁÖº¯ ÀÚÀå ¼¼±â
frontal adversive field
ÀüµÎ¿±´ëÃø¾ß(¡Óßö´å¯), Àü¿îµ¿¿ª(îñê¡ÔÑæ´).
geometric field distortion artifact
±âÇÏÇÐÀû ÀÚÀå ¿Ö°î Àΰø¹°
geometric field separtion
±âÇÏÇÐÀûÁ¶»ç¿µ¿ªºÐ¸®
geometrical field
±âÇÏÇÐÀûÁ¶»ç¿µ¿ª
gradient magnetic field
°æ»ç ÀÚ±âÀå
gravitational field
Áß·ÂÀå(ñìæ³íÞ).
high field MR scanner
°íÀÚÀå ÀÚ±â°ø¸í½ºÄ³³Ê
point outside field
Á¶»ç¿µ¿ª¹ÛÁöÁ¡
pulsed-field gel electrophoresis (PFGE)
°£Çæ¾ß Àü±â¿µµ¿
radio-frequency field
°íÁÖÆÄ ÀÚÀå
rectangular field of view (FOV)
Á÷»ç°¢Çü ½Ã¾ß
relative field
ºñ±³¿µ¿ª(ÝïÎòçÐæ´).
ÀÌÀü
¿¾ ´ëÇÑÀÇÇù 3 ÀÇÇпë¾î »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú :
15
ÆäÀÌÁö:
2
¿µ¹®
ÇѱÛ
electron microscopy
ÀüÀÚÇö¹Ì°æ°Ë»ç(¹ý)
electron microscopy
ÀüÀÚÇö¹Ì°æ°Ë»ç(¹ý)(¡ËþÞÛÛö).
electron microscopy(EM)
ÀüÀÚÇö¹Ì°æ
fluorescence microscopy
Çü±¤Çö¹Ì°æ
immune electron microscopy
¸é¿ªÀüÀÚÇö¹Ì°æ¹ý.
immune-electron microscopy
¸é¿ªÀüÀÚÇö¹Ì°æ¹ý
immunofluorescence microscopy
¸é¿ªÇü±¤Çö¹Ì°æ(°Ë»ç)¹ý.
immunologic electron microscopy
¸é¿ªÀüÀÚÇö¹Ì°æ¹ý.
light microscopy
±¤ÇÐ Çö¹Ì°æ
light microscopy
±¤ÇÐÇö¹Ì°æ°Ë»ç(¹ý)(¡ËþÞÛÛö).
microscopy
Çö¹Ì°æ°Ë»ç¹ý(¡ËþÞÛÛö).
microscopy
Çö¹Ì°æ°Ë»ç¹ý(¡ËþÞÛÛö)
microscopy
Çö¹Ì°æ
phase contrast microscopy
À§»óÂ÷(êÈßÓó¬)Çö¹Ì°æ°Ë»ç
phase-contrast microscopy
À§»óÂ÷Çö¹Ì°æ
ÀÌÀü
´ÙÀ½
ÀÌ ¾Æ·¡ ºÎÅÍ´Â °á°ú°¡ ¾ø½À´Ï´Ù.
´ëÇÑÀÇÇù ÀÇÇпë¾î »çÀü °Ë»ö ¸ÂÃã °Ë»ö °á°ú :
0
ÆäÀÌÁö:
2
¿µ¹®
ÇѱÛ
ÀÌÀü
´ëÇÑÀÇÇù Çʼö ÀÇÇпë¾îÁý »çÀü °Ë»ö ¸ÂÃã °Ë»ö °á°ú :
0
ÆäÀÌÁö:
2
¿µ¹®
ÇѱÛ
ÀÌÀü
´ëÇÑÀÇÇù Çʼö ÀÇÇпë¾îÁý »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú :
0
ÆäÀÌÁö:
2
¿µ¹®
ÇѱÛ
ÀÌÀü
¿¾ ´ëÇÑÀÇÇù ÀÇÇпë¾î »çÀü °Ë»ö ¸ÂÃã °Ë»ö °á°ú :
0
ÆäÀÌÁö:
2
¿µ¹®
ÇѱÛ
ÀÌÀü
¿¾ ´ëÇÑÀÇÇù 2 ÀÇÇпë¾î »çÀü °Ë»ö ¸ÂÃã °Ë»ö °á°ú :
0
ÆäÀÌÁö:
2
¿µ¹®
ÇѱÛ
ÀÌÀü
¿¾ ´ëÇÑÀÇÇù 3 ÀÇÇпë¾î »çÀü °Ë»ö ¸ÂÃã °Ë»ö °á°ú :
0
ÆäÀÌÁö:
2
¿µ¹®
ÇѱÛ
ÀÌÀü
ÅëÇÕ°Ë»ö ¿Ï·á
ÀÌÀü
´ÙÀ½