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"dark field microscopy"¿¡ ´ëÇÑ ´ëÇÑÀÇÇù ÀÇÇпë¾î ¼¼ºÎ °Ë»ö °á°úÀÔ´Ï´Ù
´ëÇÑÀÇÇù ÀÇÇпë¾î »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú : 15 ÆäÀÌÁö: 2
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    ÇѱÛ
  • B1 field gradient
    ȸÀüÀÚÀå±â¿ï±â
  • binocular field
    ¾ç¾È½Ã¾ß, µÎ´«½Ã¾ß
  • boost field
    Á¶»ç¿µ¿ª, Á¶»ç¸é
  • complex receptive field
    º¹ÇÕ¼ö¿ë¾ß
  • comprehensive field irradiation
    ±¤¹üÀ§Á¶»ç
  • congruous field defect
    ÀÏÄ¡½Ã¾ß°á¼Õ
  • diplopia field
    º¹½Ã½Ã¾ß, °ãº¸Àӽþß
  • electric field
    Àü±âÀå
  • electromagnetic field
    ÀüÀÚ±âÀå
  • field
    1. ºÐ¾ß, ¿µ¿ª, ¹üÀ§ 2. ºÎÀ§ 3. ½Ã¾ß 4. Àü±âÀå
  • field block
    ºÎÀ§Â÷´Ü
  • field defect
    ½Ã¾ß°á¼Õ
  • field inhomogeneity
    ÀÚÀåºÒ±ÕÁú¼º
  • field survey
    ÇöÁöÁ¶»ç
  • field test
    ½ÇÁõ°Ë»ç
¿¾ ´ëÇÑÀÇÇù ÀÇÇпë¾î »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú : 15 ÆäÀÌÁö: 2
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    ÇѱÛ
  • geometric field distortion artifact
    ±âÇÏÇÐÀûÀÚÀå¿Ö°îÀΰø¹°
  • B1 field gradient
    ȸÀüÀÚÀå±â¿ï±â
  • binocular field
    ¾ç¾È½Ã¾ß, µÎ´«½Ã¾ß
  • boost field
    Á¶»ç¿µ¿ª, Á¶»ç¸é
  • field block
    ºÎÀ§Â÷´Ü¸¶Ãë
  • complex receptive field
    º¹ÇÕ¼ö¿ë¾ß
  • comprehensive field irradiation
    ±¤¹üÀ§Á¶»ç
  • confrontation field test
    ´ë¸é½Ã¾ß°Ë»ç
  • congruous field defect
    ÀÏÄ¡½Ã¾ß°áÇÔ
  • constant field equation
    Á¤ÀüÀ广Á¤½Ä
  • diplopia field
    º¹½Ã½Ã¾ß, °ãº¸Àӽþß
  • field defect
    ½Ã¾ß°á¼Õ
  • incongruous field defect
    ºÒÀÏÄ¡½Ã¾ß°á¼Õ
  • visual field defect
    ½Ã¾ß°á¼Õ
  • electric field
    Àü±âÀå
¿¾ ´ëÇÑÀÇÇù 2 ÀÇÇпë¾î »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú : 14 ÆäÀÌÁö: 2
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    ÇѱÛ
  • fringe field
    ÁÖº¯ ¾ß
  • fringe magnetic field strength
    ÁÖº¯ ÀÚÀå ¼¼±â
  • frontal adversive field
    ÀüµÎ¿±´ëÃø¾ß(¡­Óßö´å¯), Àü¿îµ¿¿ª(îñê¡ÔÑæ´).
  • geometric field distortion artifact
    ±âÇÏÇÐÀû ÀÚÀå ¿Ö°î Àΰø¹°
  • geometric field separtion
    ±âÇÏÇÐÀûÁ¶»ç¿µ¿ªºÐ¸®
  • geometrical field
    ±âÇÏÇÐÀûÁ¶»ç¿µ¿ª
  • gradient magnetic field
    °æ»ç ÀÚ±âÀå
  • gravitational field
    Áß·ÂÀå(ñìæ³íÞ).
  • high field MR scanner
    °íÀÚÀå ÀÚ±â°ø¸í½ºÄ³³Ê
  • point outside field
    Á¶»ç¿µ¿ª¹ÛÁöÁ¡
  • pulsed-field gel electrophoresis (PFGE)
    °£Çæ¾ß Àü±â¿µµ¿
  • radio-frequency field
    °íÁÖÆÄ ÀÚÀå
  • rectangular field of view (FOV)
    Á÷»ç°¢Çü ½Ã¾ß
  • relative field
    ºñ±³¿µ¿ª(ÝïÎòçÐæ´).
¿¾ ´ëÇÑÀÇÇù 3 ÀÇÇпë¾î »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú : 15 ÆäÀÌÁö: 2
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    ÇѱÛ
  • electron microscopy
    ÀüÀÚÇö¹Ì°æ°Ë»ç(¹ý)
  • electron microscopy
    ÀüÀÚÇö¹Ì°æ°Ë»ç(¹ý)(¡­ËþÞÛÛö).
  • electron microscopy(EM)
    ÀüÀÚÇö¹Ì°æ
  • fluorescence microscopy
    Çü±¤Çö¹Ì°æ
  • immune electron microscopy
    ¸é¿ªÀüÀÚÇö¹Ì°æ¹ý.
  • immune-electron microscopy
    ¸é¿ªÀüÀÚÇö¹Ì°æ¹ý
  • immunofluorescence microscopy
    ¸é¿ªÇü±¤Çö¹Ì°æ(°Ë»ç)¹ý.
  • immunologic electron microscopy
    ¸é¿ªÀüÀÚÇö¹Ì°æ¹ý.
  • light microscopy
    ±¤ÇÐ Çö¹Ì°æ
  • light microscopy
    ±¤ÇÐÇö¹Ì°æ°Ë»ç(¹ý)(¡­ËþÞÛÛö).
  • microscopy
    Çö¹Ì°æ°Ë»ç¹ý(¡­ËþÞÛÛö).
  • microscopy
    Çö¹Ì°æ°Ë»ç¹ý(¡­ËþÞÛÛö)
  • microscopy
    Çö¹Ì°æ
  • phase contrast microscopy
    À§»óÂ÷(êÈßÓó¬)Çö¹Ì°æ°Ë»ç
  • phase-contrast microscopy
    À§»óÂ÷Çö¹Ì°æ
ÀÌ ¾Æ·¡ ºÎÅÍ´Â °á°ú°¡ ¾ø½À´Ï´Ù.
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