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"bright field microscopy"¿¡ ´ëÇÑ °Ë»ö °á°úÀÔ´Ï´Ù. °Ë»ö °á°ú º¸´Â µµÁß¿¡ Tab ۸¦ ´©¸£½Ã¸é °Ë»ö âÀÌ ¼±Åõ˴ϴÙ.
À̰ÍÀ» ¿øÇϼ̽À´Ï±î?
´ëÇÑÀÇÇù ÀÇÇпë¾î »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú : 15 ÆäÀÌÁö: 2
  • ¿µ¹®
    ÇѱÛ
  • comprehensive field irradiation
    ±¤¹üÀ§Á¶»ç
  • congruous field defect
    ÀÏÄ¡½Ã¾ß°á¼Õ
  • dark field microscope
    ¾Ï½Ã¾ßÇö¹Ì°æ
  • dark-field illumination
    ¾Ï½Ã¾ßÁ¶¸í
  • diplopia field
    º¹½Ã½Ã¾ß, °ãº¸Àӽþß
  • electric field
    Àü±âÀå
  • electromagnetic field
    ÀüÀÚ±âÀå
  • field
    1. ºÐ¾ß, ¿µ¿ª, ¹üÀ§ 2. ºÎÀ§ 3. ½Ã¾ß 4. Àü±âÀå
  • field block
    ºÎÀ§Â÷´Ü
  • field defect
    ½Ã¾ß°á¼Õ
  • field inhomogeneity
    ÀÚÀåºÒ±ÕÁú¼º
  • field survey
    ÇöÁöÁ¶»ç
  • field test
    ½ÇÁõ°Ë»ç
  • field uniformity
    Á¶»ç¿µ¿ª±ÕÀϼº, Á¶»ç¸é±ÕÀϼº
  • fringe field
    ÁÖº¯¿µ¿ª
¿¾ ´ëÇÑÀÇÇù ÀÇÇпë¾î »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú : 15 ÆäÀÌÁö: 2
  • ¿µ¹®
    ÇѱÛ
  • complex receptive field
    º¹ÇÕ¼ö¿ë¾ß
  • comprehensive field irradiation
    ±¤¹üÀ§Á¶»ç
  • confrontation field test
    ´ë¸é½Ã¾ß°Ë»ç
  • congruous field defect
    ÀÏÄ¡½Ã¾ß°áÇÔ
  • constant field equation
    Á¤ÀüÀ广Á¤½Ä
  • dark field microscope
    ¾Ï½Ã¾ßÇö¹Ì°æ
  • dark-field illumination
    ¾Ï½Ã¾ßÁ¶¸í
  • diplopia field
    º¹½Ã½Ã¾ß, °ãº¸Àӽþß
  • field defect
    ½Ã¾ß°á¼Õ
  • incongruous field defect
    ºÒÀÏÄ¡½Ã¾ß°á¼Õ
  • visual field defect
    ½Ã¾ß°á¼Õ
  • electric field
    Àü±âÀå
  • magnetic field effect
    ÀÚ±âÀåÈ¿°ú
  • pulsed-field gel electrophoresis
    °£Ç濵¿ª°ÖÀü±âÀ̵¿
  • visual field examination
    ½Ã¾ß°Ë»ç
¿¾ ´ëÇÑÀÇÇù 2 ÀÇÇпë¾î »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú : 14 ÆäÀÌÁö: 2
  • ¿µ¹®
    ÇѱÛ
  • fringe magnetic field strength
    ÁÖº¯ ÀÚÀå ¼¼±â
  • frontal adversive field
    ÀüµÎ¿±´ëÃø¾ß(¡­Óßö´å¯), Àü¿îµ¿¿ª(îñê¡ÔÑæ´).
  • geometric field distortion artifact
    ±âÇÏÇÐÀû ÀÚÀå ¿Ö°î Àΰø¹°
  • geometric field separtion
    ±âÇÏÇÐÀûÁ¶»ç¿µ¿ªºÐ¸®
  • geometrical field
    ±âÇÏÇÐÀûÁ¶»ç¿µ¿ª
  • gradient magnetic field
    °æ»ç ÀÚ±âÀå
  • gravitational field
    Áß·ÂÀå(ñìæ³íÞ).
  • high field MR scanner
    °íÀÚÀå ÀÚ±â°ø¸í½ºÄ³³Ê
  • illumination, dark-field
    ¾Ï½Ã¾ßÁ¶¸í
  • point outside field
    Á¶»ç¿µ¿ª¹ÛÁöÁ¡
  • pulsed-field gel electrophoresis (PFGE)
    °£Çæ¾ß Àü±â¿µµ¿
  • radio-frequency field
    °íÁÖÆÄ ÀÚÀå
  • rectangular field of view (FOV)
    Á÷»ç°¢Çü ½Ã¾ß
  • relative field
    ºñ±³¿µ¿ª(ÝïÎòçÐæ´).
¿¾ ´ëÇÑÀÇÇù 3 ÀÇÇпë¾î »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú : 15 ÆäÀÌÁö: 2
  • ¿µ¹®
    ÇѱÛ
  • light microscopy
    ±¤ÇÐÇö¹Ì°æ°Ë»ç(¹ý)(¡­ËþÞÛÛö).
  • microscopy
    Çö¹Ì°æ°Ë»ç¹ý(¡­ËþÞÛÛö).
  • microscopy
    Çö¹Ì°æ°Ë»ç¹ý(¡­ËþÞÛÛö)
  • microscopy
    Çö¹Ì°æ
  • phase contrast microscopy
    À§»óÂ÷(êÈßÓó¬)Çö¹Ì°æ°Ë»ç
  • phase-contrast microscopy
    À§»óÂ÷Çö¹Ì°æ
  • polarized light microscopy
    Æí±¤Çö¹Ì°æ
  • slit lamp microscopy
    ¼¼±ØµîÇö¹Ì°æ °Ë»ç(¹ý).
  • urine sediment microscopy
    ¿äħ»çÇö¹Ì°æ°â»ç
  • abutted field
    ÀÎÁ¢Á¶»ç¸é, -¿µ¿ª, Á¢ÃËÁ¶»ç¸é
  • altitudinal visual field defect
    ¼öÆò½Ã¾ß°á¼Õ
  • auditory field
    û¿ª, û¾ß
  • binocular field
    ¾ç¾È½Ã¾ß
  • blue-field entopic phenomenon
    û»ö½Ã¾ß³»½ÃÇö»ó
  • boost field
    Ãß°¡Á¶»ç¿µ¿ª, Ãß°¡Á¶»ç¸é
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  • ¿µ¹®
    ÇѱÛ
  • sedimentation field flow fractionation
    ħ°­Àå(öØË½íÞ) È帧ºÐȹ¹ý(ÝÂüñÛö)
KI ÀÇÇпë¾î »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú : 15 ÆäÀÌÁö: 2
  • ¿µ¹®
    ÇѱÛ
  • field profile
    ÀÚÀåÃø¸é»ó
  • field size
    Á¶»ç¾ßÅ©±â
  • field strength
    ÀÚÀå¼¼±â, ÀÚÀå·Â
  • field survey
    ÇöÁöÁ¶»ç
  • FOV [=field of view]
    ¿µ»ó¿µ¿ª, ¿µ»ó¹üÀ§
  • fringe field
    ÁÖº¯¾ß
  • fringe magnetic field strength
    ÁÖº¯ÀÚÀå¼¼±â
  • geometric field distortion artifact
    ±âÇÏÇÐÀûÀÚÀå¿Ö°îÀΰø¹°
  • gradient magnetic field
    °æ»çÀÚ±âÀå
  • high field MR scanner
    °íÀÚÀå ÀÚ±â°ø¸í½ºÄ³³Ê
  • horizontal field magnet
    ¼öÆò¸éÀÚ¼®
  • in-field-of-view saturation band
    ¿µ»ó¿µ¿ª³»Æ÷È­´ë
  • intermediate field MR scanner
    ÁßµîÀÚÀå ÀÚ±â°ø¸í½ºÄ³³Ê
  • irradiation field
    ¹æ»ç¼±Á¶»ç¾ß
  • low field MR scanner
    ÀúÀÚÀåÀÚ±â°ø¸í½ºÄ³³Ê
KMLE ÀÇÇоà¾î »çÀü À¯»ç °Ë»ö °á°ú : 5 ÆäÀÌÁö: 2
B1 induced field in magnetic resonance imaging; radiofrequency magnetic field in nuclear magnetic reson...
EF ectopic focus; edema factor; ejection fraction; elastic fibril; electric field; elongation factor; e...
FA false aneurysm; Families Anonymous; Fanconi anemia; far advanced; fatty acid; febrile antigen; femor...
EM   1) Erythro-Mycin
  2) Electron Microscopy
AEM Academic Emergency Medicine [journal]; analytical electron microscopy; ambulatory electrocardiograph...
KMLE ÀÚµ¿ÃßÃâ ÀÇÇоà¾î »çÀü À¯»ç °Ë»ö °á°ú : 5 ÆäÀÌÁö: 2
CMTF Confocal Microscopy Through Focusing
cryo-EM Cryo-electron microscopy
Cryo-TEM Cryo-transmission electron microscopy
EFTEM Energy-filtering transmission electron microscopy
ESEM Environmental Scanning Electron Microscopy
°æºÏ´ë Ä¡°ú´ëÇÐ ±¸°­³»°ú ±³½Ç »çÀü À¯»ç °Ë»ö °á°ú : 15 ÆäÀÌÁö: 2
  • ¿µ¹®
    ÇѱÛ
    ¼³¸í
  • eye field
    ½Ã¾ß
  • far field
    ¿ø°Å¸® ±¸¿ª
  • field
    ±¸¿ª, ¾ß, ¿µ¿ª
    1. ÀÛ¿ë ¿µ¿ª ¶Ç´Â Àå¼Ò³ª °ø°£. 2. Áö½Ä, ¿¬±¸, Á÷¾÷¿¡ À־ÀÇ Àü¹® ºÐ¾ß. 3. ¹ß»ýÇп¡ ÀÖ¾î º¯µ¿ ¿äÀÎÀÇ ¹üÀ§ ³»¿¡¼­ ºÐÈ­ÇÏ´Â ¿µ¿ª.
  • field cancerization
    ±¸¿ª ¾ÏÈ­
  • field echo
    ÀÚÀå ¿¡ÄÚ
  • field inhomogeneity
    ÀÚÀå ºÒ±ÕÀÏ, ÀÚÀå ºÒ±ÕÀϼº
  • field profile
    ÀÚÀå Ãø¸é »ó
  • field strength
    ÀÚÀå ¼¼±â, ÀÚÀå·Â
  • field survey
    ÇöÁö Á¶»ç
  • fringe field
    ÁÖº¯ ¾ß
  • fringe magnetic field strength
    ÁÖº¯ ÀÚÀå ¼¼±â
  • intermediate field MR scanner
    Áßµî ÀÚÀå Àڱ⠰ø¸í ½ºÄ³³Ê
  • irradiation field
    Á¶»ç ¾ß
  • magnet field homogeneity
    ÀÚÀå ±ÕÁú¼º
  • magnetic field gradient
    ÀÚÀå °æ»ç
CancerWEB ¿µ¿µ ÀÇÇлçÀü À¯»ç °Ë»ö °á°ú : 15 ÆäÀÌÁö: 2
microscopy, electron Visual and photographic microscopy in which electron beams with wavelengths thousands of times shorter than visible light are used in place of light, thereby allowing much greater magnification.
(12 Dec 1998)
microscopy, electron, scanning Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point, giving the surface image a three-dimensional quality.
(12 Dec 1998)
microscopy, electron, scanning transmission A type of electron microscopy which scans with an extremely narrow beam that is transmitted through the sample. The detection apparatus produces an image whose brightness depends on the atomic number of the sample. It should not be confused with microscopy, electron scanning nor with microscopy, electron, transmission (see microscopy, electron).
(12 Dec 1998)
microscopy, fluorescence Microscopy of specimens stained with fluorescent dye (usually fluorescein isothiocyanate) or of naturally fluorescent materials, which emit light when exposed to ultraviolet or blue light. Immunofluorescence microscopy utilises antibodies that are labelled with fluorescent dye.
(12 Dec 1998)
microscopy, immunoelectron Microscopy in which the samples are first stained immunocytochemically and then examined using an electron microscope. Immunoelectron microscopy is used extensively in diagnostic virology as part of very sensitive immunoassays.
(12 Dec 1998)
microscopy, interference Microscopy in which physiological and photometric contrast in the image is influenced or produced by the action of optical components which regulate interference.
(12 Dec 1998)
microscopy, phase-contrast A form of interference microscopy in which variations of the refracting index in the object are converted into variations of intensity in the image. This is achieved by the action of a phase plate.
(12 Dec 1998)
microscopy, polarization Microscopy using polarised light in which phenomena due to the preferential orientation of optical properties with respect to the vibration plane of the polarised light are made visible and correlated parameters are made measurable.
(12 Dec 1998)
microscopy, scanning tunneling Electron microscopy in which a very sharp conducting needle is swept just a few angstroms above the surface of a sample. The tiny tunneling current that flows between the sample and the needle tip is measured and from this are produced three-dimensional topographs, with a lateral resolution often as good as 1-2 angstroms and a vertical resolution of less than 1 angstrom. Due to their composition, biological samples are usually coated with a conductive layer, e.g., by depositing a thin metal or carbon film on top of the sample, to enhance their conductivity.
(12 Dec 1998)
microscopy, ultraviolet Microscopy in which the image is formed by ultraviolet radiation and is displayed and recorded by means of photographic film.
(12 Dec 1998)
microscopy, video Microscopy in which television cameras are used to brighten magnified images that are otherwise too dark to be seen with the naked eye. It is used frequently in telepathology.
(12 Dec 1998)
confocal microscopy <procedure> A system of (usually) epifluorescence light microscopy in which a fine laser beam of light is scanned over the object through the objective lens. The technique is particularly good at rejecting light from outside the plane of focus and so produces higher effective resolution than is normally achieved.
(18 Nov 1997)
Conventional Transmission Electron Microscopy <technique> A term applied to 'normal' transmission electron microscopy imaging. The electron beam is passed through a thin film sample (typically ~1-200 nm thick). Bright field diffraction contrast images are formed with the direct (undiffracted) beam. Dark field images are formed with a selected diffracted beam. CTEM imaging is used in the general observation of samples and careful selection of the diffracting conditions of the sample will allow the analysis of defect structures within the sample.
(05 Aug 1998)
polarization microscopy <procedure> Any form of microscopy capable of detecting birefringent objects. Usually performed with a polarizing element below the stage to produce plane polarized light and an analyser that is set to give total extinction of the background and thus to detect any birefringence.
(18 Nov 1997)
scanning electron microscopy <procedure> Technique of electron microscopy in which the specimen is coated with heavy metal and then scanned by an electron beam. The image is built up on a monitor screen (in the same way as the raster builds a conventional television image). The resolution is not so great as with transmission electron microscopy, but preparation is easier (often by fixation followed by critical point drying), the depth of focus is relatively enormous, the surface of a specimen can be seen (though not the interior unless the specimen is cracked open) and the image is aesthetically pleasing.
(18 Nov 1997)
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    ÇѱÛ
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    ¿Á¼ö¼ö
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    ¾à½Ä ±º¹ý ȸÀÇ
  • field day
    ¾ß¿Ü ¿¬±¸ÀÏ;äÁýÀÏ;Ưº°ÇÑ »ý»ç°¡ ÀÖ´Â ³¯
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