MI : KMLE 의학 검색 엔진 - 의학사전, 의학용어, 의학약어, 의학논문, 약품/의약품 검색

MeSH(Medical Subject Headings) 맞춤 검색 (http://www.nlm.nih.gov) 결과 : 5 페이지: 18

Microscopy, Atomic Force - 새창 A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.
Synonyms : Atomic Force Microscopies, Force Microscopies, Force Microscopies, Scanning, Force Microscopy, Scanning, Microscopies, Atomic Force, Microscopies, Force, Microscopies, Scanning Force, Microscopy, Force, Microscopy, Scanning Force, Scanning Force Microscopies
Microscopy, Confocal - 새창 A light microscopic technique in which only a small spot is illuminated and observed at a time. An image is constructed through point-by-point scanning of the field in this manner. Light sources may be conventional or laser, and fluorescence or transmitted observations are possible.
Synonyms : Confocal Laser Scanning Microscopy, Confocal Microscopies, Laser Microscopies, Laser Scanning Microscopies, Microscopies, Confocal, Microscopies, Laser, Microscopies, Laser Scanning, Microscopy, Laser, Microscopy, Laser Scanning, Scanning Microscopies, Laser
Microscopy, Electron - 새창 Microscopy using an electron beam, instead of light, to visualize the sample, thereby allowing much greater magnification. The interactions of ELECTRONS with specimens are used to provide information about the fine structure of that specimen. In TRANSMISSION ELECTRON MICROSCOPY the reactions of the electrons that are transmitted through the specimen are imaged. In SCANNING ELECTRON MICROSCOPY an electron beam falls at a non-normal angle on the specimen and the image is derived from the reactions occurring above the plane of the specimen.
Synonyms :
Microscopy, Electron, Scanning - 새창 Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.
Synonyms : Electron Scanning Microscopy, Electron Microscopies, Scanning, Electron Microscopy, Scanning, Electron Scanning Microscopies, Microscopies, Electron Scanning, Microscopies, Scanning Electron, Microscopy, Electron Scanning, Microscopy, Scanning Electron
Microscopy, Electron, Scanning Transmission - 새창 A type of TRANSMISSION ELECTRON MICROSCOPY in which the object is examined directly by an extremely narrow electron beam scanning the specimen point-by-point and using the reactions of the electrons that are transmitted through the specimen to create the image. It should not be confused with SCANNING ELECTRON MICROSCOPY.
Synonyms :