| scalar |
Any physical quantity with a field that can be described by a single numerical value at each point in space. A scalar quantity is distinguished from a vector quantity by the fact that a scalar quantity possesses only magnitude, whereas a vector quantity possesses both magnitude and direction. Thus, pressure is a scalar quantity and velocity is a vector quantity.
출처: amsglossary.allenpress.com/glossary/browse
|
|---|---|
| scanning |
In radar meteorology, the motion of the radar antenna during data collection. Scanning usually follows a systematic pattern involving one of the following: 1) In horizontal scanning, used to generate PPI displays, the antenna is continuously rotated in azimuth around the horizon or is rotated back and forth in a sector (sector scanning); at the completion of each 360?or sector scan, the elevation angle of the scan typically is increased; 2) Vertical scanning, used to generate RHI displays ...
출처: amsglossary.allenpress.com/glossary/browse
|
| scatter diagram |
(Also called scattergram.) A plot representing corresponding observed values of two variables x and y as points in Cartesian coordinates. If the two variables are functionally related, the points will be bunched, but if they are not functionally related, the points will be scattered uniformly over the plane. Scatter diagrams are used to explore the influence of one variable upon another, strong relationships being revealed as a concentration around a definite curve.
출처: amsglossary.allenpress.com/glossary/browse
|
| scattering |
A specification of the angular distribution of the electromagnetic energy scattered by a particle or a scattering medium. The differential (scattering) cross section is defined as the ratio of the intensity of radiant energy scattered in a given direction to the incident irradiance and thus has dimensions of area per unit solid angle. The symbol is frequently used for scattering cross section and d /d for the differential cross section.
출처: amsglossary.allenpress.com/glossary/browse
|
| scanning electron microscope |
(SEM) An electron-beam-based microscope used to examine, in a three dimensional screen image, the surface structure of prepared specimens.
출처: www.fao.org/docrep/003/X3910E/X3910E22.htm
|