| scanning electron microscope |
(SEM) An electron-beam-based microscope used to examine, in a three dimensional screen image, the surface structure of prepared specimens.
출처: www.fao.org/docrep/003/X3910E/X3910E22.htm
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| scanning electron microscope |
a microscope that uses a finely focused electron beam scanned across a sample to produce high resolution images. A SEM can resolve much smaller feature than a standard microscope, down to approximately 2 nanometers.
출처: www.icknowledge.com/glossary/s.html
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| scanning electron microscope |
Device used in photomicrography.
출처: www.startphoto.com/learn/glossary/glossary_s-sh.ht...
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| scanning electron microscope |
a microscope that uses electrons to produce an image of the surface of small structures
출처: microbes.limnology.wisc.edu/outreach/glossary.php
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