| 영문 | electron microscope | 한글 | 전자현미경 |
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| 설명 | 전기 마당 또는 자기 마당을 이용하여 전자류를 전자 렌즈에 집속시켜, 그 통로에 놓인 표본의 상을 확대하는 장치. 광학 현미경보다 훨씬 뛰어난 분해 능력을 가진다. |
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| 영문 | nuclear medicine | 한글 | 핵의학 |
|---|---|---|---|
| 설명 | 방사성을 띠는 핵물질을 이용하여 의학에 응용하는 학문. 대개 인체에 큰 해가 없는 방사선물질을 사용하며, 반감기가 짧아 사용후에도 큰 해가 없다. 이런 핵의학적 물질을 이용한 핵의학적 진단의 가장 큰 장점은 생체내에서 일어나는 그 기관의 실제적인 기능을 알아볼 수 있다는 데 있다. 흔히 접하는 X-선을 이용한 진단방법은 단지 그 순간만의 영상을 접하여 실제로 보이는 부위가 얼마나 기능을 수행하는지 알 수 없는 단점이 있으나, 핵의학에서는 실제적인 기능의 정도에 따라 영상이 나오게 되므로 기능판별에 아주 유리하다. 하지만, 정확한 판별력이 있는 영상을 얻기에는 부족하다. 또한 핵의학은 진단외의 치료에도 사용되는데, 예를 들어 갑상샘종양의 경우 여러 곳에 이미 전이가 되어 있을 경우 방사선핵종을 이용하여 다른 곳에 큰 부작용없이 치료가 가능하다. |
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| 영문 | nuclear magnetic resonance(NMR) | 한글 | 핵자기공명 |
|---|---|---|---|
| 설명 | 다른 말로 MRI=Magnetic Resonance Imaging 자기공명영상이라고도 한다. 인체의 장기나, 병적인 모양, 종양의 위치, 림프절의 비대 등에 대한 진단을 내리기 위해 시행하는 방사선학적인 검사방법이다. 현재 많이 쓰이고 있는 컴퓨터단층촬영(CT=computerized tomography)과는 다른 방법으로 시행하며, 그 해상도가 컴퓨터단층촬영보다는 뛰어나 비록 고가이긴 하지만, 많이 쓰이고 있다. 또한 인체에 무해하고, 여러 가지 면(plane)에서 사람을 단층시켜 볼 수 있다. 단점은 심장박동기를 설치한 사람이나, 주위에 자장을 띠는 물체를 몸에 지니고 있는 중환자 등에서는 이용할 수 없고, 복부장기에 대한 진단에는 컴퓨터단층촬영보다 떨어지는 것으로 되어 있다. |
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| EM | early memory; ejection murmur; electromagnetic; electron micrograph; electron microscopy, electron m... |
|---|---|
| EI | Edmonton injector; electrolyte imbalance; electron impact; electron ionization; emotionally impaired... |
| E/M | electron microscope, electron microscopy; evaluation and management |
| ENDOR | electron nuclear double resonance |
| NM | near-miss; neomycin; neuromedin; neuromuscular; neutrophil migration; nictitating membrane; nitrogen... |
| ENDOR | Electron Nuclear DOuble Resonance |
|---|---|
| nuclear VV | nuclear volume |
| AES | Augar electron spectroscopy |
| BSE | Back scattered electron |
| BEI | Backscattered Electron Imaging |
| aperture for electron microscopy | <technique> Anode aperture: The opening in the accelerating voltage anode shield of the electron gun through which the electrons must pass to irradiate the specimen. Condenser aperture: An opening in the condenser lens controlling the number of electrons entering the lens and the angular aperture of the electron beam. The angular aperture can also be controlled by the condenser lens current. Physical objective aperture: A metallic diaphragm, with a small central hole, used to limit the cone of electrons accepted by the objective lens. This improves image-contrast since highly scattered electrons are prevented from arriving at the Gaussian image plane and therefore cannot contribute to background fog. Aplanatic. Free from spherical aberration and coma. (05 Aug 1998) |
|---|---|
| Auger electron | An electron ejected from a lower energy orbital after a photoelectric interaction of an X-ray photon with a K-shell electron by the characteristic radiation photon; the Auger electron recoils with energy equal to the characteristic radiation less the difference in shell binding energies. See: photoelectric effect. (05 Mar 2000) |
| backscattered electron | <microscopy> Produced by an incident electron colliding with the nucleus of an atom in the specimen. The incident electron is then scattered backward about 180 degrees with no appreciable loss of energy, an elastic collision. (05 Aug 1998) |
| backscattered electron imaging | <microscopy> The production of backscattered electrons from a sample varies directly with the specimen's average atomic number, higher atomic number elements produce more backscattered electrons than lower atomic number ones. Detection of Backscattered Electrons is achieved by using a donut shaped solid state saemiconductor device mounted on the bottom of the objective lens. When Backscattered Electrons strike the detector electron-hole pairs are created which are then counted. This quantity is translated into a pixel intensity and displayed on the CRT, forming the image. By splitting the detector into halves (or quadrants) differences in the signal level on the individual detector segments provide surface topography information. (05 Aug 1998) |
| valence electron | One of the electron's that take part in chemical reactions of an atom. (05 Mar 2000) |
| Parallel Electron Energy Loss Spectroscopy | <technique> Electron energy loss spectroscopy analyses the inelastically scattered electrons present in the beam after it has been transmitted through the sample. An electron energy loss spectrum typically consists of a monatomic decreasing background on which are superimposed a number of peaks. Each peak is characteristic of the scattering process that has occurred in the sample. The peaks can be used to obtain information about the chemical composition and electronic structure of the sample. Electron energy loss spectra are acquired typically in a magnetic sector spectrometer located under the camera chamber of the transmission electron microscope. Spatial resolution is typically limited by the minimum probe diameter of the microscope. Electron energy loss spectroscopy tends to be complimentary to EDS in that it can be used to analyse very thin samples of low Z materials. Acronym: PEELS (05 Aug 1998) |
| reverse electron transport | <chemistry> The energy-dependent movement of electrons against the thermodynamic gradient to form a strong reductant from a weaker electron donor. (11 Jan 1998) |
| microscope, electron | <microscopy> An electron-optical device which produces a magnified image of an object. Detail may be revealed by virtue of selective transmission, reflection, or emission of electrons by the object. (05 Aug 1998) |
| microscopy, electron | Visual and photographic microscopy in which electron beams with wavelengths thousands of times shorter than visible light are used in place of light, thereby allowing much greater magnification. (12 Dec 1998) |
| microscopy, electron, scanning | Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point, giving the surface image a three-dimensional quality. (12 Dec 1998) |
| microscopy, electron, scanning transmission | A type of electron microscopy which scans with an extremely narrow beam that is transmitted through the sample. The detection apparatus produces an image whose brightness depends on the atomic number of the sample. It should not be confused with microscopy, electron scanning nor with microscopy, electron, transmission (see microscopy, electron). (12 Dec 1998) |
| Conventional Transmission Electron Microscopy | <technique> A term applied to 'normal' transmission electron microscopy imaging. The electron beam is passed through a thin film sample (typically ~1-200 nm thick). Bright field diffraction contrast images are formed with the direct (undiffracted) beam. Dark field images are formed with a selected diffracted beam. CTEM imaging is used in the general observation of samples and careful selection of the diffracting conditions of the sample will allow the analysis of defect structures within the sample. (05 Aug 1998) |
| Convergent Beam Electron Diffraction | <microscopy> An electron probe is tightly focused on a transmission electron microscopy specimen and the resulting pattern of diffracted electrons is observed. The patterns contains information on the crystal symmetry and atomic and electronic structure of the sample. Regions as small as 0.2 nm may be examined. Acronym: CBED (05 Aug 1998) |
| conversion electron | An internal conversion electron. (05 Mar 2000) |
| positive electron | A subatomic particle of mass and charge equal to the electron but of opposite (i.e., positive) charge. Synonym: positive electron. (05 Mar 2000) |
제품명 |
판매사 |
보험코드 | 성분/함량 | 구분/보험급여 |
|---|
제품명 |
판매사 |
보험코드 | 성분/함량 | 구분/보험급여 |
|---|