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¿µ¹® electron microscope ÇÑ±Û ÀüÀÚÇö¹Ì°æ
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  Àü±â ¸¶´ç ¶Ç´Â Àڱ⠸¶´çÀ» ÀÌ¿ëÇÏ¿© ÀüÀÚ·ù¸¦ ÀüÀÚ ·»Áî¿¡ Áý¼Ó½ÃÄÑ, ±× Åë·Î¿¡ ³õÀΠǥº»ÀÇ »óÀ» È®´ëÇϴ ÀåÄ¡. ±¤ÇРÇö¹Ì°æº¸´Ù ÈξÀ ¶Ù¾î³­ ºÐÇØ ´É·ÂÀ» °¡Áø´Ù. 
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  • ¿µ¹®
    ÇѱÛ
  • electron microscopy
    ÀüÀÚÇö¹Ì°æ°Ë»ç(¹ý)
  • dark field microscopy
    ¾Ï½Ã¾ßÇö¹Ì°æ°Ë»ç(¹ý)
  • fluorescence microscopy
    Çü±¤Çö¹Ì°æ°Ë»ç(¹ý)
  • fluorescent microscopy
    Çü±¤Çö¹Ì°æ¹ý
  • immunofluorescence microscopy
    ¸é¿ªÇü±¤Çö¹Ì°æ°Ë»ç(¹ý)
  • microscopy
    Çö¹Ì°æ°Ë»ç(¹ý)
  • polarized light microscopy
    Æí±¤Çö¹Ì°æ°Ë»ç(¹ý)
  • electron
    ÀüÀÚ
  • electron affinity
    ÀüÀÚģȭ·Â
  • electron beam
    ÀüÀÚ¼±, ÀüÀÚºö
  • electron capture
    ÀüÀÚÆ÷ȹ
  • electron carrier
    ÀüÀÚ¿î¹Ýü
  • electron configuration
    ÀüÀÚ¹èÄ¡
  • electron density
    ÀüÀڹеµ
  • electron diffraction
    ÀüÀÚȸÀý
´ëÇÑÀÇÇù Çʼö ÀÇÇпë¾îÁý »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú : 4 ÆäÀÌÁö: 1
  • ¿µ¹®
    ÇѱÛ
  • microscopy
    Çö¹Ì°æ°Ë»ç(¹ý)
  • electron
    ÀüÀÚ
  • electron microscope
    ÀüÀÚÇö¹Ì°æ
  • transmission electron microscope
    Åõ°úÀüÀÚÇö¹Ì°æ
¿¾ ´ëÇÑÀÇÇù ÀÇÇпë¾î »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú : 15 ÆäÀÌÁö: 1
  • ¿µ¹®
    ÇѱÛ
  • electron microscopy
    ÀüÀÚÇö¹Ì°æ°Ë»ç
  • dark field microscopy
    ¾Ï½Ã¾ßÇö¹Ì°æ°Ë»ç
  • fluorescence microscopy
    Çü±¤Çö¹Ì°æ°Ë»ç
  • immunofluorescence microscopy
    ¸é¿ªÇü±¤Çö¹Ì°æ°Ë»ç¹ý
  • microscopy
    Çö¹Ì°æ°Ë»ç(¹ý)
  • polarized light microscopy
    Æí±¤Çö¹Ì°æ°Ë»ç
  • electron affinity
    ÀüÀÚģȭ·Â
  • electron microscopic autoradiography
    ÀüÀÚÇö¹Ì°æÀÚ°¡¹æ»ç¼±¼ú
  • electron beam
    ÀüÀÚ¼±
  • electron capture
    ÀüÀÚÆ÷ȹ
  • electron carrier
    ÀüÀÚ¿î¹Ýü
  • electron configuration
    ÀüÀÚ¹èÄ¡
  • orbital electron capture
    ±ËµµÀüÀÚÆ÷ȹ
  • electron density
    ÀüÀڹеµ
  • electron diffraction
    ÀüÀÚȸÀý
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  • ¿µ¹®
    ÇѱÛ
  • immune electron microscopy
    ¸é¿ªÀüÀÚÇö¹Ì°æ¹ý.
  • immune-electron microscopy
    ¸é¿ªÀüÀÚÇö¹Ì°æ¹ý
  • immunologic electron microscopy
    ¸é¿ªÀüÀÚÇö¹Ì°æ¹ý.
  • Darkfield microscopy
    ¾Ï½Ã¾ßÇö¹Ì°æ
  • free electron
    ÀÚÀ¯ÀüÀÚ(í»ë¦ï³í­).
  • free electron
    ÀÚÀ¯ÀüÀÚ
  • high electron density
    °íÀüÀڹеµ(ÍÔï³í­ÚËöô).
  • immunofluorescence microscopy
    ¸é¿ªÇü±¤Çö¹Ì°æ(°Ë»ç)¹ý.
  • phase contrast microscopy
    À§»óÂ÷(êÈßÓó¬)Çö¹Ì°æ°Ë»ç
  • phase-contrast microscopy
    À§»óÂ÷Çö¹Ì°æ
  • polarized light microscopy
    Æí±¤Çö¹Ì°æ
  • positive electron
    ¾çÀüÀÚ
  • recoil electron
    ¹ÝµµÀüÀÚ
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  • ¿µ¹®
    ÇѱÛ
  • electron microscopy
    ÀüÀÚÇö¹Ì°æ°Ë»ç(¹ý)
  • electron microscopy
    ÀüÀÚÇö¹Ì°æ°Ë»ç(¹ý)(¡­ËþÞÛÛö).
  • electron microscopy(EM)
    ÀüÀÚÇö¹Ì°æ
  • immune electron microscopy
    ¸é¿ªÀüÀÚÇö¹Ì°æ¹ý.
  • immune-electron microscopy
    ¸é¿ªÀüÀÚÇö¹Ì°æ¹ý
  • immunologic electron microscopy
    ¸é¿ªÀüÀÚÇö¹Ì°æ¹ý.
  • odd electron ; unpaired electron
    ºÒ´ëÀüÀÚ, ºñ´ëÀüÀÚ.
  • odd electron ; unpaired electron
    ȦÀüÀÚ.
  • bright field microscopy
    ¸í½Ã¾ß Çö¹Ì°æ¹ý
  • brightfield microscopy
    ¸í½Ã¾ß Çö¹Ì°æ
  • dark field microscopy
    ¾Ï½Ã¾ßÇö¹Ì°æ
  • fluorescence microscopy
    Çü±¤Çö¹Ì°æ
  • immunofluorescence microscopy
    ¸é¿ªÇü±¤Çö¹Ì°æ(°Ë»ç)¹ý.
  • light microscopy
    ±¤ÇÐ Çö¹Ì°æ
  • light microscopy
    ±¤ÇÐÇö¹Ì°æ°Ë»ç(¹ý)(¡­ËþÞÛÛö).
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  • ¿µ¹®
    ÇѱÛ
  • fluorescence microscopy
    Çü±¤ Çö¹Ì°æ¹ý(û«ÎÃúéÚ°ÌðÛö)
  • conversion electron
    ÀüȯÀüÀÚ(ï®üµï³í­)
  • cyclic electron flow
    ¼øÈ¯(âàü») ÀüÀÚ(ï³í­) È帧
  • electron
    ÀüÀÚ(ï³í­)
  • electron acceptor
    ÀüÀÚ ¼ö³³Ã¼(ï³í­ áôÒ¡ô÷)
  • electron affinity
    "ÀüÀÚ Ä£È­¼º(ï³í­öÑûúàõ)(µµ,Óø)"
  • electron capture
    ÀüÀÚ Æ÷ȹ(ï³í­øÚüò)
  • electron carrier
    ÀüÀÚ¿î¹ÝÀÚ(ï³í­ê¡Úæí­)
  • electron diffraction
    ÀüÀÚȸÀý(ï³í­üÞï¹)
  • electron donor
    ÀüÀÚ°ø¿©Ã¼(ï³í­Íêæ¨ô÷)
  • electron-exchange resin
    ÀüÀÚ±³È¯ ¼öÁö(ï³í­Îßüµâ§ò·)
  • electron ionization mass spectrometry
    ÀüÀÚ(ï³í­)ÀÌ¿ÂÈ­(ûù) Áú·® ºÐ¼®¹ý(òõÕáÝÂà°Ûö)
  • electron magnetic resonance
    ÀüÀÚ ÀÚ±â°ø¸í(ï³í­í¸Ñ¨ÍìÙ°)
  • electron microscope
    ÀüÀÚÇö¹Ì°æ(ï³í­úéÚ°Ìð)
  • electron microscope radioautography
    ÀüÀÚÇö¹Ì°æ ÀÚ°¡¹æ»ç±â·Ï¹ý(ï³í­úéÚ°Ìðí»Ê«Û¯ÞÒÑÀÖâÛö)
KI ÀÇÇпë¾î »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú : 13 ÆäÀÌÁö: 1
  • ¿µ¹®
    ÇѱÛ
  • electron
    ÀüÀÚ
  • electron beam
    ÀüÀÚ¼±
  • electron capture
    ÀüÀÚÆ÷Âø
  • electron density
    ÀüÀڹеµ
  • electron emission
    ÀüÀÚ¹æÃâ
  • electron microscope
    ÀüÀÚÇö¹Ì°æ
  • electron pair
    ÀüÀÚ½Ö
  • electron ray
    ÀüÀÚ¼±
  • electron volt
    ÀüÀÚº¼Æ®
  • electron wave
    ÀüÀÚÆÄ
  • free electron
    ÀÚÀ¯ ÀüÀÚ
  • proton electron dipole dipole interaction
    ¾çÀÚÀüÀÚ½Ö±ØÀÚ½Ö±ØÀÚ»óÈ£¹ÝÀÀ
  • recoil electron
    ¹ÝµµÀüÀÚ
KMLE ÀÇÇоà¾î »çÀü À¯»ç °Ë»ö °á°ú : 5 ÆäÀÌÁö: 1
EM early memory; ejection murmur; electromagnetic; electron micrograph; electron microscopy, electron m...
E/M electron microscope, electron microscopy; evaluation and management
EM   1) Erythro-Mycin
  2) Electron Microscopy
AEM Academic Emergency Medicine [journal]; analytical electron microscopy; ambulatory electrocardiograph...
ATEM analytic transmission electron microscopy
KMLE ÀÚµ¿ÃßÃâ ÀÇÇоà¾î »çÀü À¯»ç °Ë»ö °á°ú : 5 ÆäÀÌÁö: 1
cryo-EM Cryo-electron microscopy
Cryo-TEM Cryo-transmission electron microscopy
EFTEM Energy-filtering transmission electron microscopy
ESEM Environmental Scanning Electron Microscopy
FESEM Field Emission Scanning Electron Microscopy
°æºÏ´ë Ä¡°ú´ëÇÐ ±¸°­³»°ú ±³½Ç »çÀü À¯»ç °Ë»ö °á°ú : 15 ÆäÀÌÁö: 1
  • ¿µ¹®
    ÇѱÛ
    ¼³¸í
  • immune electron microscopy
    ¸é¿ª ÀüÀÚÇö¹Ì°æ¹ý
  • scanning electron microscopy
    ÁÖ»ç ÀüÀÚÇö¹Ì°æ
    ÀüÀÚ¼±ÀÌ Ç¥º»»óÀÇ Á¡¸¶´Ù ÁÖ»çÇÏ¿© À½±Ø¼±°ü
  • microscopy
    Çö¹Ì°æ °Ë»ç¹ý
    Çö¹Ì°æÀ» ÀÌ¿ëÇÑ °Ë»ç ¶Ç´Â °üÂû.
  • electron
    ÀüÀÚ
    À½ Àü±âÀÇ ÃÖ¼Ò ´ÜÀ§ ¶Ç´Â ÀÚ±â ÀÔÀÚ. Àý´ë Á¤Àü±â ´ÜÀ§. 4.77*10-10 ¶Ç´Â Àý´ë ÀüÀڱ⠴ÜÀ§ 1.59*10-20 ¿¡ »ó´çÇϸç, ±×ÀÇ Áú·®Àº Àû´çÇÑ ¼Óµµ·Î À̵¿Çϰí ÀÖÀ» ¶§¿¡ ¼ö¼Ò ¿øÀÚÀÇ 1/1845, Áï 9*10-28 ±×·¥ÀÌ´Ù. µµÃ¼ Áß¿¡ È帣´Â ÀüÀÚ´Â Àü·ù·Î¼­, ¹æ»ç¼± ¹°Áú·ÎºÎÅÍ´Â ¥â¼±À¸·Î ¹æÃâµÇ¾î ¿øÀÚÇÙ ÁÖÀ§ÀÇ ±Ëµµ¸¦ ȸÀüÇÏ¿© ±× ¿øÀÚÀÇ Áú·®°ú ¹æ»ç´É ÀÌ¿ÜÀÇ ÀÌÈ­ÇÐÀû ¼º»óÀ» Á¿ìÇÑ´Ù.
  • electron affinity
    ÀüÀÚ Ä£È­·Â
    ¿øÀÚ°¡ ÀüÀÚ 1°³¿Í °áÇÕÇÒ ¶§¿¡ ¹æÃâÇÏ´Â ¿¡³ÊÁö.
  • electron bath
    ÀüÇØÁ¶
  • electron beam microporbe analysis
    ÀüÀÚ±¤ ¹Ì¼¼ Žħ ¿ä¼Ò ºÐ¼®, ÀüÀÚ±¤ ¹Ì¼¼ Žħ ºÐ¼®
  • electron beam therapy
    ÀüÀÚ¼± Ä¡·á
  • electron carrier
    ÀüÀÚ ¿î¹Ýü
  • electron configuration
    ÀüÀÚ ¹èÄ¡
  • electron density
    ÀüÀÚ ¹Ðµµ
    ÀüÀÚÇö¹Ì°æ¿¡¼­ ÀüÀÚÀÇ Åõ°ú¸¦ ¸·À» ¼ö ÀÖ´Â µÎ²² ¶Ç´Â ¹Ðµµ.
  • electron emission
    ÀüÀÚ ¹æÃâ
    ¿øÀÚ¿¡ ¹æ»ç´ÉÀ» ÁÖ´Â ÀüÀÚÀÇ Çϳª.
  • electron hole
    ÀüÀÚ ±¸¸Û
  • electron microprobe analysis
    ÀüÀÚ ¹Ì¼¼ Žħ
  • electron microscopic radioautography
    ÀüÇö¹æ»ç¼± ÀÚ°¡ ±â·Ï¹ý, ÀüÇö ÀÚ±â¹ý
CancerWEB ¿µ¿µ ÀÇÇлçÀü ¸ÂÃã °Ë»ö °á°ú : 3 ÆäÀÌÁö: 1
microscopy, electron Visual and photographic microscopy in which electron beams with wavelengths thousands of times shorter than visible light are used in place of light, thereby allowing much greater magnification.
(12 Dec 1998)
microscopy, electron, scanning Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point, giving the surface image a three-dimensional quality.
(12 Dec 1998)
microscopy, electron, scanning transmission A type of electron microscopy which scans with an extremely narrow beam that is transmitted through the sample. The detection apparatus produces an image whose brightness depends on the atomic number of the sample. It should not be confused with microscopy, electron scanning nor with microscopy, electron, transmission (see microscopy, electron).
(12 Dec 1998)
CancerWEB ¿µ¿µ ÀÇÇлçÀü À¯»ç °Ë»ö °á°ú : 15 ÆäÀÌÁö: 1
aperture for electron microscopy <technique> Anode aperture: The opening in the accelerating voltage anode shield of the electron gun through which the electrons must pass to irradiate the specimen. Condenser aperture: An opening in the condenser lens controlling the number of electrons entering the lens and the angular aperture of the electron beam.
The angular aperture can also be controlled by the condenser lens current. Physical objective aperture: A metallic diaphragm, with a small central hole, used to limit the cone of electrons accepted by the objective lens. This improves image-contrast since highly scattered electrons are prevented from arriving at the Gaussian image plane and therefore cannot contribute to background fog. Aplanatic. Free from spherical aberration and coma.
(05 Aug 1998)
Conventional Transmission Electron Microscopy <technique> A term applied to 'normal' transmission electron microscopy imaging. The electron beam is passed through a thin film sample (typically ~1-200 nm thick). Bright field diffraction contrast images are formed with the direct (undiffracted) beam. Dark field images are formed with a selected diffracted beam. CTEM imaging is used in the general observation of samples and careful selection of the diffracting conditions of the sample will allow the analysis of defect structures within the sample.
(05 Aug 1998)
scanning electron microscopy <procedure> Technique of electron microscopy in which the specimen is coated with heavy metal and then scanned by an electron beam. The image is built up on a monitor screen (in the same way as the raster builds a conventional television image). The resolution is not so great as with transmission electron microscopy, but preparation is easier (often by fixation followed by critical point drying), the depth of focus is relatively enormous, the surface of a specimen can be seen (though not the interior unless the specimen is cracked open) and the image is aesthetically pleasing.
(18 Nov 1997)
scanning transmission electron microscopy <procedure> Method of electron microscopy in which image formation depends upon analysis of the pattern of energies of electrons that pass through the specimen. Has comparable resolving power to conventional transmission EM.
(18 Nov 1997)
immune electron microscopy Electron microscopy of biological specimens to which specific antibody has been bound.
(05 Mar 2000)
electron microscopy <procedure> Any form of microscopy in which the interactions of electrons with the specimens are used to provide information about the final structure of that specimen.
In transmission electron microscopy the diffraction and adsorption of electrons as the electron beam passes normally through the specimen is imaged to provide information on the specimen.
In scanning electron microscopy an electron beam falls at a nonnormal angle on the specimen and the image is derived from the scattered and reflected electrons. Secondary X-rays generated by the interaction of electrons with various elements in the specimen may be used for electron microprobe analysis.
(18 Nov 1997)
transmission electron microscopy <technique> Those forms of electron microscopy in which electrons are transmitted through the object to be imaged, suffering energy loss by diffraction and to a small extent by absorption.
Acronym: TEM
(18 Nov 1997)
Environmental Scanning Electron Microscopy <technique> Scanning electron microscopy is performed by scanning a focused probe across the surface of the sample to be studied. In the environmental scanning electron microscopy the composition and pressure of the atmosphere around the specimen may be controlled. In favourable cases non-conductive specimens may be examined without coating, and hydrated specimens may be examined with the water still in place.
Acronym: ESEM
(05 Aug 1998)
bright field microscopy <technique> Optical microscopy, in which absorption to a great extent and diffraction to a minor extent give rise to the image, as opposed to phase contrast or interference methods of microscopy.
(18 Nov 1997)
ratio imaging fluorescence microscopy <procedure> A method of measurement of intracellular pH or intracellular calcium levels, using a fluorescent probe molecule (see fura-2), in which the two different excitation wavelengths are used and the emitted light levels compared.
If emission at one wavelength is sensitive to the intracellular ion level and emission at the other wavelength is not, then standardisation for intracellular probe concentration, efficiency of light collection, inactivation of probe and thickness of cytoplasm can all be performed automatically.
(17 Dec 1997)
reflection X-ray microscopy <technique> A method of producing enlarged images by means of X rays. In this method the radiation is totally reflected at glancing incidence from polished concave mirrors or from the curved surfaces of single crystals by Bragg reflection. The problem of aberration corrections still limits the resolution obtainable.
(05 Aug 1998)
video microscopy <technique> Microscopy that takes advantage of video as an imaging, image processing, analysing, or controlling device.
(05 Aug 1998)
phase contrast microscopy <investigation> A simple nonquantitative form of interference micoscopy of great utility in visualising live cells. Small differences in optical path length due to differences in refractive index and thickness of structures are visualised as differences in light intensity.
(18 Nov 1997)
microscopy <technique> The science of the interpretive use, and applications of microscopes.
(05 Aug 1998)
microscopy, atomic force Microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. A microcomputer keeps track of the vertical excursions as a function of the position of the probe in the horizontal plane and presents the sample's image.
(12 Dec 1998)
MeSH(Medical Subject Headings) ¸ÂÃã °Ë»ö (http://www.nlm.nih.gov) °á°ú : 4 ÆäÀÌÁö: 1
  • Microscopy, Electron - »õâ Microscopy using an electron beam, instead of light, to visualize the sample, thereby allowing much greater magnification. The interactions of ELECTRONS with specimens are used to provide information about the fine structure of that specimen. In TRANSMISSION ELECTRON MICROSCOPY the reactions of the electrons that are transmitted through the specimen are imaged. In SCANNING ELECTRON MICROSCOPY an electron beam falls at a non-normal angle on the specimen and the image is derived from the reactions occurring above the plane of the specimen.
    Synonyms :
  • Microscopy, Electron, Scanning - »õâ Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY.
    Synonyms : Electron Scanning Microscopy, Electron Microscopies, Scanning, Electron Microscopy, Scanning, Electron Scanning Microscopies, Microscopies, Electron Scanning, Microscopies, Scanning Electron, Microscopy, Electron Scanning, Microscopy, Scanning Electron
  • Microscopy, Electron, Scanning Transmission - »õâ A type of TRANSMISSION ELECTRON MICROSCOPY in which the object is examined directly by an extremely narrow electron beam scanning the specimen point-by-point and using the reactions of the electrons that are transmitted through the specimen to create the image. It should not be confused with SCANNING ELECTRON MICROSCOPY.
    Synonyms :
  • Microscopy, Electron, Transmission - »õâ Electron microscopy in which the ELECTRONS or their reaction products that pass down through the specimen are imaged below the plane of the specimen.
    Synonyms : Diffraction Microscopy, Electron, Microscopy, Transmission Electron
ÇÑ¿µ/¿µÇÑ »çÀü À¯»ç °Ë»ö °á°ú : 15 ÆäÀÌÁö: 1
  • ¿µ¹®
    ÇѱÛ
  • microscopy
    Çö¹Ì°æ °Ë»ç(»ç¿ë¹ý)
  • electron
    ÀüÀÚ
  • electron
    ÀüÀÚ
  • electron affinity
    (¹°)ÀüÀÚ Ä£È­·Â
  • electron beam
    (¹°)ÀüÀÚ ºö(Àü°è,ÀÚ°è¿¡¼­ ÇÑ ¹æÇâÀ¸·Î ¸ð¾ÆÁ® È帣´Â ÀüÀÚÀÇ È帧)
  • electron beam melting
    (±Ý¼Ó)ÀüÀÚºö ¿ëÇØ¹ý Àå
  • electron bomb
    ÀÏ·ºÆ®·Ð ¼ÒÀÌź
  • electron gas
    (¹°)ÀüÀÚ ±âü(°¡½º)
  • electron gun
    ÀüÀÚÃÑ(ºê¶ó¿î°üÀÇ ÀÜÀÚ·ù ÁýÁß°ü) )
  • electron lens
    ÀüÀÚ ·»Áî
  • electron microseope
    ÀüÀÚ Çö¹Ì°æ
  • electron optics
    ÀüÀÚ °øÇÐ
  • electron spin resonance
    (¹°)ÀüÀÚ ½ºÇÉ °ø¸í
  • electron telescope
    ÀüÀÚ ¸Á¿ø°æ
  • electron tube
    ÀüÀÚ°ü(X¼±°ü µûÀ§)
ÀÌ ¾Æ·¡ ºÎÅÍ´Â °á°ú°¡ ¾ø½À´Ï´Ù.
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