| 영문 | Gram stain | 한글 | 그람염색 |
|---|---|---|---|
| 설명 | 미생물을 염색하는 방법 중의 하나. 1884년 덴마크의 의사 H.C.J. 그람(1853~ 1938)이 고안한 특수 염색법이다. 이 염색법을 사용하면 미생물은 양성균과 음성균의 2무리로 크게 나뉜다. 염색법은 균을 유리면에 바르고 가열 고정한다. 젠시안바이오렛, 크리스탈 바이오렛, 메틸바이오렛 등 파라로즈 아닐린계 색소의 어느 하나를 사용하여 우선 염색하고 이어서 루골액을 작용시킨 뒤, 에탄올 또는 아세톤으로 탈색한다. 이때 탈색되지 않고 보라색을 타나내는 것을 그람양성균이라 부르며, 포도알균-폐렴알균-사슬알균 등이 대표적인 예이다. 탈색되면 그람음성균이라 부르며, 대장균-녹농균 등이 있다. 최후에 사프라닌, 푹신 등 적색계의 색소액으로 후염색을 한다. 미생물의 감별에 중요한 염색법이며 염색성의 차이는 영양요구성, 화학요법제(항생물질 등)에 대한 감수성의 차이와도 관련되는 점이 많으므로 사용약제의 선택시에도 중요한 역할을 한다. 그람양성균과 음성균의 차이는 세균벽의 구조에 있는데, 양성균은 세포막의 바깥쪽 펩티드글리칸이라는 당단백질층의 두께가 20~80nm나 되고, 그램음성균의 펩티드글리칸 층은 2~3nm로 얇고, 다시 바깥쪽에 외막이라 부르는 층이 있다. |
||
| 영문 | electron microscope | 한글 | 전자현미경 |
|---|---|---|---|
| 설명 | 전기 마당 또는 자기 마당을 이용하여 전자류를 전자 렌즈에 집속시켜, 그 통로에 놓인 표본의 상을 확대하는 장치. 광학 현미경보다 훨씬 뛰어난 분해 능력을 가진다. |
||
| AFB Stain | Acid Fast Bacilli Stain |
|---|---|
| HE stain | Hematoxylin-Eosin stain |
| WS | Waardenburg syndrome; ward secretary; Warkany syndrome; Warthin-Starry [stain]; water soluble; water... |
| EM | early memory; ejection murmur; electromagnetic; electron micrograph; electron microscopy, electron m... |
| EI | Edmonton injector; electrolyte imbalance; electron impact; electron ionization; emotionally impaired... |
| PWS | Port Wine Stain |
|---|---|
| AES | Augar electron spectroscopy |
| BSE | Back scattered electron |
| BEI | Backscattered Electron Imaging |
| CBED | Convergent Beam Electron Diffraction |
Zeune's law 맹인의 수는 적도에 가까운 열대지방에서 증가한다.
zidovudin
| aperture for electron microscopy | <technique> Anode aperture: The opening in the accelerating voltage anode shield of the electron gun through which the electrons must pass to irradiate the specimen. Condenser aperture: An opening in the condenser lens controlling the number of electrons entering the lens and the angular aperture of the electron beam. The angular aperture can also be controlled by the condenser lens current. Physical objective aperture: A metallic diaphragm, with a small central hole, used to limit the cone of electrons accepted by the objective lens. This improves image-contrast since highly scattered electrons are prevented from arriving at the Gaussian image plane and therefore cannot contribute to background fog. Aplanatic. Free from spherical aberration and coma. (05 Aug 1998) |
|---|---|
| Auger electron | An electron ejected from a lower energy orbital after a photoelectric interaction of an X-ray photon with a K-shell electron by the characteristic radiation photon; the Auger electron recoils with energy equal to the characteristic radiation less the difference in shell binding energies. See: photoelectric effect. (05 Mar 2000) |
| backscattered electron | <microscopy> Produced by an incident electron colliding with the nucleus of an atom in the specimen. The incident electron is then scattered backward about 180 degrees with no appreciable loss of energy, an elastic collision. (05 Aug 1998) |
| backscattered electron imaging | <microscopy> The production of backscattered electrons from a sample varies directly with the specimen's average atomic number, higher atomic number elements produce more backscattered electrons than lower atomic number ones. Detection of Backscattered Electrons is achieved by using a donut shaped solid state saemiconductor device mounted on the bottom of the objective lens. When Backscattered Electrons strike the detector electron-hole pairs are created which are then counted. This quantity is translated into a pixel intensity and displayed on the CRT, forming the image. By splitting the detector into halves (or quadrants) differences in the signal level on the individual detector segments provide surface topography information. (05 Aug 1998) |
| valence electron | One of the electron's that take part in chemical reactions of an atom. (05 Mar 2000) |
| Parallel Electron Energy Loss Spectroscopy | <technique> Electron energy loss spectroscopy analyses the inelastically scattered electrons present in the beam after it has been transmitted through the sample. An electron energy loss spectrum typically consists of a monatomic decreasing background on which are superimposed a number of peaks. Each peak is characteristic of the scattering process that has occurred in the sample. The peaks can be used to obtain information about the chemical composition and electronic structure of the sample. Electron energy loss spectra are acquired typically in a magnetic sector spectrometer located under the camera chamber of the transmission electron microscope. Spatial resolution is typically limited by the minimum probe diameter of the microscope. Electron energy loss spectroscopy tends to be complimentary to EDS in that it can be used to analyse very thin samples of low Z materials. Acronym: PEELS (05 Aug 1998) |
| reverse electron transport | <chemistry> The energy-dependent movement of electrons against the thermodynamic gradient to form a strong reductant from a weaker electron donor. (11 Jan 1998) |
| microscope, electron | <microscopy> An electron-optical device which produces a magnified image of an object. Detail may be revealed by virtue of selective transmission, reflection, or emission of electrons by the object. (05 Aug 1998) |
| microscopy, electron | Visual and photographic microscopy in which electron beams with wavelengths thousands of times shorter than visible light are used in place of light, thereby allowing much greater magnification. (12 Dec 1998) |
| microscopy, electron, scanning | Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point, giving the surface image a three-dimensional quality. (12 Dec 1998) |
| microscopy, electron, scanning transmission | A type of electron microscopy which scans with an extremely narrow beam that is transmitted through the sample. The detection apparatus produces an image whose brightness depends on the atomic number of the sample. It should not be confused with microscopy, electron scanning nor with microscopy, electron, transmission (see microscopy, electron). (12 Dec 1998) |
| Conventional Transmission Electron Microscopy | <technique> A term applied to 'normal' transmission electron microscopy imaging. The electron beam is passed through a thin film sample (typically ~1-200 nm thick). Bright field diffraction contrast images are formed with the direct (undiffracted) beam. Dark field images are formed with a selected diffracted beam. CTEM imaging is used in the general observation of samples and careful selection of the diffracting conditions of the sample will allow the analysis of defect structures within the sample. (05 Aug 1998) |
| Convergent Beam Electron Diffraction | <microscopy> An electron probe is tightly focused on a transmission electron microscopy specimen and the resulting pattern of diffracted electrons is observed. The patterns contains information on the crystal symmetry and atomic and electronic structure of the sample. Regions as small as 0.2 nm may be examined. Acronym: CBED (05 Aug 1998) |
| conversion electron | An internal conversion electron. (05 Mar 2000) |
| positive electron | A subatomic particle of mass and charge equal to the electron but of opposite (i.e., positive) charge. Synonym: positive electron. (05 Mar 2000) |
제품명 |
판매사 |
보험코드 | 성분/함량 | 구분/보험급여 |
|---|
제품명 |
판매사 |
보험코드 | 성분/함량 | 구분/보험급여 |
|---|