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"electron perturbation"¿¡ ´ëÇÑ ´ëÇÑÀÇÇù ÀÇÇпë¾î ¼¼ºÎ °Ë»ö °á°úÀÔ´Ï´Ù
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  • ¿µ¹®
    ÇѱÛ
  • electron perturbation
    ÀüÀÚ±³¶õ
´ëÇÑÀÇÇù ÀÇÇпë¾î »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú : 15 ÆäÀÌÁö: 1
  • ¿µ¹®
    ÇѱÛ
  • frequency perturbation
    À½Á¶º¯µ¿·ü
  • perturbation
    1. ÀڱðüÅë±â¹ý 2. µ¿¿ä, ±³¶õ
  • perturbation instrument
    ÀڱðüÅë±âÁø´ÜÄ¡·á±â, ³­°üÅë±âÁø´ÜÄ¡·á±â
  • electron
    ÀüÀÚ
  • electron affinity
    ÀüÀÚģȭ·Â
  • electron beam
    ÀüÀÚ¼±, ÀüÀÚºö
  • electron capture
    ÀüÀÚÆ÷ȹ
  • electron carrier
    ÀüÀÚ¿î¹Ýü
  • electron configuration
    ÀüÀÚ¹èÄ¡
  • electron density
    ÀüÀڹеµ
  • electron diffraction
    ÀüÀÚȸÀý
  • electron emission
    ÀüÀÚ¹æÃâ
  • electron interrupter
    ÀüÀÚÂ÷´Ü±â
  • electron microscope
    ÀüÀÚÇö¹Ì°æ
  • electron microscopic autoradiography
    ÀüÀÚÇö¹Ì°æÀÚ°¡Á¶Á÷¹æ»ç¼±ÃÔ¿µ(¼ú)
´ëÇÑÀÇÇù Çʼö ÀÇÇпë¾îÁý »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú : 3 ÆäÀÌÁö: 1
  • ¿µ¹®
    ÇѱÛ
  • electron
    ÀüÀÚ
  • electron microscope
    ÀüÀÚÇö¹Ì°æ
  • transmission electron microscope
    Åõ°úÀüÀÚÇö¹Ì°æ
¿¾ ´ëÇÑÀÇÇù ÀÇÇпë¾î »çÀü °Ë»ö ¸ÂÃã °Ë»ö °á°ú : 1 ÆäÀÌÁö: 1
  • ¿µ¹®
    ÇѱÛ
  • electron perturbation
    ÀüÀÚ±³¶õ
¿¾ ´ëÇÑÀÇÇù ÀÇÇпë¾î »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú : 15 ÆäÀÌÁö: 1
  • ¿µ¹®
    ÇѱÛ
  • frequency perturbation
    À½Á¶º¯µ¿À²
  • perturbation
    µ¿¿ä
  • electron affinity
    ÀüÀÚģȭ·Â
  • electron microscopic autoradiography
    ÀüÀÚÇö¹Ì°æÀÚ°¡¹æ»ç¼±¼ú
  • electron beam
    ÀüÀÚ¼±
  • electron capture
    ÀüÀÚÆ÷ȹ
  • electron carrier
    ÀüÀÚ¿î¹Ýü
  • electron configuration
    ÀüÀÚ¹èÄ¡
  • orbital electron capture
    ±ËµµÀüÀÚÆ÷ȹ
  • electron density
    ÀüÀڹеµ
  • electron diffraction
    ÀüÀÚȸÀý
  • electron capture detector
    ÀüÀÚÆ÷ÂøÅ½Áö±â
  • electron
    ÀüÀÚ
  • electron emission
    ÀüÀÚ¹æÃâ
  • electron gun
    ÀüÀÚÃÑ
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  • ¿µ¹®
    ÇѱÛ
  • amplitude perturbation
    À½°­µµ º¯µ¿À²
  • frequency perturbation
    À½Á¶ÀÇ º¯µ¿À²
  • perturbation
    °­ÁøÅÁ.
  • perturbation of protein
    ´Ü¹éÁúº¯ÅÂ(Ó±ÛÜòõ ܨ÷¾).
  • free electron
    ÀÚÀ¯ÀüÀÚ(í»ë¦ï³í­).
  • free electron
    ÀÚÀ¯ÀüÀÚ
  • high electron density
    °íÀüÀڹеµ(ÍÔï³í­ÚËöô).
  • immune electron microscopy
    ¸é¿ªÀüÀÚÇö¹Ì°æ¹ý.
  • immune-electron microscopy
    ¸é¿ªÀüÀÚÇö¹Ì°æ¹ý
  • immunologic electron microscopy
    ¸é¿ªÀüÀÚÇö¹Ì°æ¹ý.
  • positive electron
    ¾çÀüÀÚ
  • recoil electron
    ¹ÝµµÀüÀÚ
¿¾ ´ëÇÑÀÇÇù 3 ÀÇÇпë¾î »çÀü °Ë»ö ¸ÂÃã °Ë»ö °á°ú : 1 ÆäÀÌÁö: 1
  • ¿µ¹®
    ÇѱÛ
  • electron perturbation
    ÀüÀÚ±³¶õ
¿¾ ´ëÇÑÀÇÇù 3 ÀÇÇпë¾î »çÀü °Ë»ö À¯»ç °Ë»ö °á°ú : 15 ÆäÀÌÁö: 1
  • ¿µ¹®
    ÇѱÛ
  • odd electron ; unpaired electron
    ºÒ´ëÀüÀÚ, ºñ´ëÀüÀÚ.
  • odd electron ; unpaired electron
    ȦÀüÀÚ.
  • amplitude perturbation
    À½°­µµ º¯µ¿À²
  • frequency perturbation
    À½Á¶ÀÇ º¯µ¿À²
  • order of perturbation
    ¼·µ¿ÀÇ Â÷¼ö(àîÔÑ¡­ó­ â¦).
  • perturbation
    °­ÁøÅÁ.
  • perturbation of protein
    ´Ü¹éÁúº¯ÅÂ(Ó±ÛÜòõ ܨ÷¾).
  • auger electron
    ¿ÀÁ¦ÀüÀÚ
  • electron
    ÀüÀÚ
  • electron
    ÀüÀÚ(ï³í­)
  • electron affinity
    ÀüÀÚģȭ·Â(¡­öÑûúæ³).
  • electron avalanche
    ÀüÀÚ»çÅÂ(¡­ÞÞ÷À).
  • electron beam
    ÀüÀÚ¼±(ï³í­àÊ).
  • electron beam contamination
    ÀüÀÚ¼±¿À¿°
  • electron beam flatness
    ÀüÀÚ¼±ÆíÆòµµ
ÀÌ ¾Æ·¡ ºÎÅÍ´Â °á°ú°¡ ¾ø½À´Ï´Ù.
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  • ¿µ¹®
    ÇѱÛ
¿¾ ´ëÇÑÀÇÇù 2 ÀÇÇпë¾î »çÀü °Ë»ö ¸ÂÃã °Ë»ö °á°ú : 0 ÆäÀÌÁö: 1
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    ÇѱÛ
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