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"Selected Area Electron Diffraction"¿¡ ´ëÇÑ ´ëÇÑ»ýÈÇкÐÀÚ»ý¹°ÇÐȸ ÀÇÇпë¾î ¼¼ºÎ °Ë»ö °á°úÀÔ´Ï´Ù
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maximum height-area method
Ãִ뱤¿ª¹ý(õÌÓÞÎÆæ´Ûö)
electron diffraction
ÀüÀÚȸÀý(ï³íüÞï¹)
low-energy electron diffraction
Àú(î¸)¿¡³ÊÁö ÀüÀÚȸÀý(ï³íüÞï¹)
hybrid-selected translation
Æ¢±â-¼±º°(àÔܬ) ¹ø¿ª(Ûèæ»)
selected ion monitoring
¼±ÅÃ(àÔ÷É) À̿ ¸ð´ÏÅ͹ý(Ûö)
selected marker
¼±ÅÃÇ¥Áö(àÔ÷Éøöò½)
selected medium
"¼±ÅùèÁö(àÔ÷ÉÛÆò¢), ¼±Åà ¹è¾ç¾×(àÔ÷ÉÛÆå×äû)"
diffraction
ȸÀý(üÞï¹)
diffraction spot
ȸÀýÁ¡(üÞï¹ïÇ)
large-angle X-ray diffraction
±¤°¢(ÎÆÊÇ) X-¼±È¸Àý(àÍüÞï¹)
low-angle x-ray diffraction
¼Ò°¢(á³ÊÇ) X-¼±È¸Àý(àÊüÞï¹)
small-angle x-ray diffraction
¼Ò°¢(á³ÊÇ) X-¼±(àÊ) ȸÀý(üÞï¹)
x-ray diffraction
X¼±(àÊ) ȸÀý(üÞï¹)
x-ray diffraction pattern
X¼±(àÊ) ȸÀý(üÞï¹) ÆÐÅÏ
conversion electron
ÀüȯÀüÀÚ(ï®üµï³í)
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