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"Selected Area Electron Diffraction"¿¡ ´ëÇÑ ´ëÇÑ»ýÈ­ÇкÐÀÚ»ý¹°ÇÐȸ ÀÇÇпë¾î ¼¼ºÎ °Ë»ö °á°úÀÔ´Ï´Ù
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    ÇѱÛ
  • maximum height-area method
    Ãִ뱤¿ª¹ý(õÌÓÞÎÆæ´Ûö)
  • electron diffraction
    ÀüÀÚȸÀý(ï³í­üÞï¹)
  • low-energy electron diffraction
    Àú(î¸)¿¡³ÊÁö ÀüÀÚȸÀý(ï³í­üÞï¹)
  • hybrid-selected translation
    Æ¢±â-¼±º°(àÔܬ) ¹ø¿ª(Ûèæ»)
  • selected ion monitoring
    ¼±ÅÃ(àÔ÷É) À̿ ¸ð´ÏÅ͹ý(Ûö)
  • selected marker
    ¼±ÅÃÇ¥Áö(àÔ÷Éøöò½)
  • selected medium
    "¼±ÅùèÁö(àÔ÷ÉÛÆò¢), ¼±Åà ¹è¾ç¾×(àÔ÷ÉÛÆå×äû)"
  • diffraction
    ȸÀý(üÞï¹)
  • diffraction spot
    ȸÀýÁ¡(üÞï¹ïÇ)
  • large-angle X-ray diffraction
    ±¤°¢(ÎÆÊÇ) X-¼±È¸Àý(àÍüÞï¹)
  • low-angle x-ray diffraction
    ¼Ò°¢(á³ÊÇ) X-¼±È¸Àý(àÊüÞï¹)
  • small-angle x-ray diffraction
    ¼Ò°¢(á³ÊÇ) X-¼±(àÊ) ȸÀý(üÞï¹)
  • x-ray diffraction
    X¼±(àÊ) ȸÀý(üÞï¹)
  • x-ray diffraction pattern
    X¼±(àÊ) ȸÀý(üÞï¹) ÆÐÅÏ
  • conversion electron
    ÀüȯÀüÀÚ(ï®üµï³í­)
ÀÌ ¾Æ·¡ ºÎÅÍ´Â °á°ú°¡ ¾ø½À´Ï´Ù.
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