| EM | early memory; ejection murmur; electromagnetic; electron micrograph; electron microscopy, electron m... |
|---|---|
| SEM | sample evaluation method; scanning electron microscopy; secondary enrichment medium; standard error ... |
| TSEM | transmission scanning electron microscopy |
| E/M | electron microscope, electron microscopy; evaluation and management |
| CSLM | confocal scanning microscopy |