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"Effect of reduced temperature, unspecified"¿¡ ´ëÇÑ ´ëÇÑ»ýÈ­ÇкÐÀÚ»ý¹°ÇÐȸ ÀÇÇпë¾î ¼¼ºÎ °Ë»ö °á°úÀÔ´Ï´Ù
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  • reduced mean residue rotation
    ȯ»ê Æò±Õ Àܱâ ȸÀü(üµß©øÁгíÑÐñüÞï®)
  • reduced osmotic pressure
    ȯ»ê »ïÅõ¾Ð(üµß©ß¶÷âäâ)
  • reduced scattered light intensity
    ȯ»ê »ê¶õ±¤ °­µµ(üµß©ß¤Õ¯ÎÃË­Óø)
  • reduced substrate concentration
    ȯ»ê ±âÁú ³óµµ(üµß©Ñ¨òõÒØÓø)
  • reduced viscosity
    ȯ»ê Á¡µµ(üµß©ïÄÓø)
  • absolute temperature
    Àý´ë¿Âµµ (ï¾Óßè®Óø)
  • critical temperature
    ÀÓ°è ¿Âµµ(×üÍ£è®Óø)
  • high-temperature protection regulon
    °í¿Âº¸È£(ÍÔè®ÜÁûÞ) ·¹±Ö·Ð
  • high-temperature-short-time method
    °í¿Â ´Ü½Ã°£¹ý(ÍÔè®Ó­ãÁÊàÛö)
  • Kelvin temperature scale
    Ä̺ó¿Âµµ(è®Óø) ´«±Ý
  • Krafft temperature
    Å©¶óÇÁÆ®¿Âµµ(è®Óø)
  • low-temperature heat method
    Àú¿Â¿­¹ý(î¸è®æðÛö)
  • melting temperature
    À¶Çؿµµ(ë×ú°è®Óø)
  • optimum temperature
    ÃÖÀû¿Âµµ(õÌîêè®Óø)
  • solid substrate room temperature phosphorescence
    °íü±âÁú ½Ç¿ÂÀα¤¹ý(ͳô÷Ðñòõ ãøè®ìÝÎÃÛö)
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